Structural characterization of Si0.7Ge0.3layers grown on Si(001) substrates by molecular beam epitaxy
1990 ◽
Vol 8
(3)
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pp. 1577-1581
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2000 ◽
Vol 360
(1-2)
◽
pp. 195-204
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Keyword(s):
Keyword(s):
Keyword(s):
1994 ◽
Vol 137
(3-4)
◽
pp. 393-399
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