Electrical characterization of defects introduced in n-Ge during electron beam deposition or exposure

2013 ◽  
Vol 114 (17) ◽  
pp. 173708 ◽  
Author(s):  
S. M. M. Coelho ◽  
F. D. Auret ◽  
P. J. Janse van Rensburg ◽  
J. M. Nel
Keyword(s):  
Electron Beam ◽  
Electrical Characterization ◽  
Electron Beam Deposition ◽  
Beam Deposition

Electrical characterization of defects introduced in n-Si during electron beam deposition of Pt

2012 ◽  
Vol 209 (10) ◽  
pp. 1926-1933 ◽  
Author(s):  
F. D. Auret ◽  
S. M. M. Coelho ◽  
J. M. Nel ◽  
W. E. Meyer
Keyword(s):  
Electron Beam ◽  
Electrical Characterization ◽  
Electron Beam Deposition ◽  
Beam Deposition

Electrical characterization of defects introduced in Ge during electron beam deposition of different metals

2008 ◽  
Vol 205 (1) ◽  
pp. 159-161 ◽  
Author(s):  
F. D. Auret ◽  
S. M. M. Coelho ◽  
M. Hayes ◽  
W. E. Meyer ◽  
J. M. Nel
Keyword(s):  
Electron Beam ◽  
Electrical Characterization ◽  
Electron Beam Deposition ◽  
Beam Deposition

scholarly journals Optical characterization of photosensitive AMTIR-1 chalcogenide thin layers deposited by electron beam deposition

2016 ◽  
Vol 442 ◽  
pp. 22-28 ◽  
Author(s):  
Alexandre Joërg ◽  
Fabien Lemarchand ◽  
Mengxue Zhang ◽  
Michel Lequime ◽  
Julien Lumeau
Keyword(s):  
Electron Beam ◽  
Optical Characterization ◽  
Thin Layers ◽  
Electron Beam Deposition ◽  
Beam Deposition
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