High precision electronic charge density determination for L10-ordered γ-TiAl by quantitative convergent beam electron diffraction

2012 ◽  
Vol 92 (35) ◽  
pp. 4408-4424 ◽  
Author(s):  
Xiahan Sang ◽  
Andreas Kulovits ◽  
Guofeng Wang ◽  
Jörg Wiezorek
Keyword(s):  
Electron Diffraction ◽  
Charge Density ◽  
High Precision ◽  
Convergent Beam Electron Diffraction ◽  
Electronic Charge ◽  
Electronic Charge Density ◽  
Beam Electron ◽  
Density Determination ◽  
Convergent Beam

scholarly journals On the experimental determination of low-order structure factors in TiAl by energy-filtered convergent-beam electron diffraction

1993 ◽  
Vol 51 ◽  
pp. 662-663
Author(s):  
S. Swaminathan ◽  
I. P. Jones ◽  
N. J. Zaluzec ◽  
D. M. Maher ◽  
H. L. Fraser
Keyword(s):  
Electron Diffraction ◽  
Charge Density ◽  
Structure Factor ◽  
Convergent Beam Electron Diffraction ◽  
Order Structure ◽  
Electron Charge Density ◽  
Beam Electron ◽  
Structure Factors ◽  
Convergent Beam ◽  
Low Order

It has been claimed that the effective Peierls stresses and mobilities of certain dislocations in TiAl are influenced by the anisotropy of bonding charge densities. This claim is based on the angular variation of electron charge density calculated by theory. It is important to verify the results of these calculations experimentally, and the present paper describes a series of such experiments. A description of the bonding charge density distribution in materials can be obtained by utilizing the charge deformation density (Δρ (r)) defined by(1) where V is the volume of the unit cell, Fobs is the experimentally determined low order structure factor and Fcalc is the structure factor calculated using the Hartree-Fock neutral atom model. To determine the experimental low order structure factors, a technique involving a combination of convergent beam electron diffraction (CBED) and electron energy loss spectroscopy (EELS) has been used.

Effect of Mn doping on charge density in γ-TiAl by quantitative convergent beam electron diffraction

1995 ◽  
Vol 72 (3) ◽  
pp. 579-601 ◽  
Author(s):  
R. Holmestad ◽  
J. M. Zuo ◽  
J. C. H. Spence ◽  
R. Hoiert ◽  
Z. Horita
Keyword(s):  
Electron Diffraction ◽  
Charge Density ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Mn Doping ◽  
Convergent Beam
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