scholarly journals Experimental correlations for transient soot measurement in diesel exhaust aerosol with light extinction, electrical mobility and diffusion charger sensor techniques

2014 ◽  
Vol 25 (6) ◽  
pp. 065204 ◽  
Author(s):  
Vicente Bermúdez ◽  
José V Pastor ◽  
J Javier López ◽  
Daniel Campos
Keyword(s):  
Diesel Exhaust ◽  
Light Extinction ◽  
Electrical Mobility ◽  
Soot Measurement ◽  
And Diffusion ◽  
Diffusion Charger

Forward-illumination light-extinction technique for soot measurement

2006 ◽  
Vol 45 (9) ◽  
pp. 2046 ◽  
Author(s):  
Yi Xu ◽  
Chia-fon F. Lee
Keyword(s):  
Light Extinction ◽  
Soot Measurement

0741 Soot Measurement in Diesel Exhaust Gas using Laser-Induced Incandescence

2007 ◽  
Vol 2007.3 (0) ◽  
pp. 243-244
Author(s):  
Fumihiro FUJIKAKE ◽  
Yukihiro TAYA ◽  
Kazuhiro YAMAMOTO ◽  
Naoki HAYASHI ◽  
Hiroshi YAMASHITA ◽  
...  
Keyword(s):  
Diesel Exhaust ◽  
Exhaust Gas ◽  
Laser Induced Incandescence ◽  
Soot Measurement

scholarly journals Soot Measurement and Application on Diesel Exhaust Gas Using Laser-Induced Incandescence

2008 ◽  
Vol 74 (738) ◽  
pp. 498-504 ◽  
Author(s):  
Kazuhiro YAMAMOTO ◽  
Fumihiro FUJIKAKE ◽  
Yukihiro TAYA ◽  
Naoki HAYASHI ◽  
Hiroshi YAMASHITA ◽  
...  
Keyword(s):  
Diesel Exhaust ◽  
Exhaust Gas ◽  
Laser Induced Incandescence ◽  
Soot Measurement

Meridional Circulation, Turbulence, and Diffusion Processes in Stars

1976 ◽  
Vol 32 ◽  
pp. 109-116 ◽  
Author(s):  
S. Vauclair
Keyword(s):  
Convection Zone ◽  
Diffusion Processes ◽  
Meridional Circulation ◽  
Diffusion Time ◽  
Work In Progress ◽  
First Results ◽  
Stellar Envelopes ◽  
And Diffusion ◽  
Turbulence And Diffusion ◽  
Hr Diagram

This paper gives the first results of a work in progress, in collaboration with G. Michaud and G. Vauclair. It is a first attempt to compute the effects of meridional circulation and turbulence on diffusion processes in stellar envelopes. Computations have been made for a 2 Mʘstar, which lies in the Am - δ Scuti region of the HR diagram.Let us recall that in Am stars diffusion cannot occur between the two outer convection zones, contrary to what was assumed by Watson (1970, 1971) and Smith (1971), since they are linked by overshooting (Latour, 1972; Toomre et al., 1975). But diffusion may occur at the bottom of the second convection zone. According to Vauclair et al. (1974), the second convection zone, due to He II ionization, disappears after a time equal to the helium diffusion time, and then diffusion may happen at the bottom of the first convection zone, so that the arguments by Watson and Smith are preserved.

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

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