Electronic structure and defect states of transition films from amorphous to microcrystalline silicon studied by surface photovoltage spectroscopy
2019 ◽
Vol 123
(17)
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pp. 10795-10801
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2011 ◽
Vol 176
(5)
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pp. 446-452
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Keyword(s):
1993 ◽
Vol 8
(9)
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pp. 1724-1727
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