scholarly journals Estimate the Parallel System Reliability in Stress-Strength Model Based on Exponentiated Inverted Weibull Distribution

2021 ◽  
Vol 1879 (2) ◽  
pp. 022105
Author(s):  
Eman A Abdulateef ◽  
Abbas N Salman ◽  
Adil Abdulkadhim Hussein
2018 ◽  
Vol 7 (1) ◽  
pp. 73-83
Author(s):  
Farhah Izzatul Jannah ◽  
Sudarno Sudarno ◽  
Alan Prahutama

Reliability analysis is the analysis of the possibility that the product or service will function properly for a certain period of time under operating conditions without failure. One configuration of components that can be formed is a series-parallel system on a filter capacitor circuit using 4 components consisting of 2 rectifier diodes, 1 capacitor, and 1 load resistor. The data used to obtain the value of system reliability is the time of failure based on the assumption of failure of the independent component. The function of the form on the system can be expressed by Ф(x)= x1x3 + x1x4 + x2x3 + x2x4 - x1x3x4 - x2x3x4 - x1x2x3 - x1x2x4 + x1x2x3x4. The parameter values of each distribution are calculated using the Median Rank Regression Estimation (MRRE) and Maximum Likelihood Estimation (MLE) methods. To test the data following a certain distribution or not, the calculation is manually done with the Anderson-Darling (AD) test so that it is known that the failure time data of rectifier diode 1 follows the weibull distribution with parameters  and , failure time data of rectifier diode 2 follows weibull distribution with parameters  and , failure time data of capacitors follow normal distribution with parameters  and , and the failure time data of the load resistor following the gamma distribution with parameters  and . From the calculation of system reliability, it shows that the higher the intensity of the system fails it will affect the value of reliability to be lower. A serial system from a parallel system functions if there is at least one component j in one subsystem that functions. Keywords: Reliability, Series-Parallel, MRRE, MLE, AD.


2018 ◽  
Vol 35 (10) ◽  
pp. 2414-2435
Author(s):  
Neama Temraz

Purpose The purpose of this paper is to analyze a parallel system consisting of n dependent components with lifetimes following Weibull distribution. FGM Copula in multivariate case is used to generate the reliability function of the original system. A reduction method is introduced to improve system reliability. Other methods of hot, cold and warm duplication are established to improve system reliability. An application is introduced to show the results and compare between different improvement methods. Design/methodology/approach In this paper, a study of a parallel system consisting of n dependent and non-identical components is introduced. Reliability function of the original system is derived by using the concepts of copula, subject to Weibull distribution. Reliability function of the original system is improved according to reduction, hot duplication, warm and cold duplication methods. Reliability equivalence factors are introduced to compare between different system designs. Numerical illustration and real-time data application are discussed to show the results obtained in this paper. Findings Copulas can be used to model the reliability of systems with dependent units. Originality/value This paper is original. Improvement of the reliability of dependent systems is not discussed in literature. Copula is a useful tool to analyze the reliability of dependent systems. The introduced model is considered as a generalization of the models discussed in literature.


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