Optical Dielectric Function of the Lithium-Fluoride Crystal

1973 ◽  
Vol 30 (26) ◽  
pp. 1313-1315 ◽  
Author(s):  
W. Paul Menzel ◽  
Chun C. Lin ◽  
Doyle F. Fouquet ◽  
Earl E. Lafon ◽  
Roy C. Chaney
1973 ◽  
Vol 31 (5) ◽  
pp. 340-340
Author(s):  
W. Paul Menzel ◽  
Chun C. Lin ◽  
Doyle F. Fouquet ◽  
Earl E. Lafon ◽  
Roy C. Chanel

2007 ◽  
Vol 74 (11) ◽  
pp. 776
Author(s):  
A. I. Ignat'ev ◽  
N. V. Nikonorov ◽  
I. V. Mochalov ◽  
E. V. Tsygankova ◽  
V. M. Reĭterov

2017 ◽  
Vol 120 (5) ◽  
pp. 56003 ◽  
Author(s):  
E. Nichelatti ◽  
M. Piccinini ◽  
A. Ampollini ◽  
L. Picardi ◽  
C. Ronsivalle ◽  
...  

2012 ◽  
Vol 9 (12) ◽  
pp. 2231-2234 ◽  
Author(s):  
Anatoly Faenov ◽  
Masahito Matsubayashi ◽  
Tatiana Pikuz ◽  
Yuji Fukuda ◽  
Masaki Kando ◽  
...  

2017 ◽  
Vol 6 (1) ◽  
pp. 48-55
Author(s):  
Surajit Saha ◽  
Suvajit Pal ◽  
Jayanta Ganguly ◽  
Manas Ghosh

We investigate the total optical dielectric function (TODF) of impurity doped quantum dot (QD) in presence and absence of noise. Noise invoked is Gaussian white noise and the QD is doped with Gaussian impurity. Noise has been introduced to the system additively and multiplicatively. The TODF profiles have been monitored as a function of incident photon energy for different values of several important parameters. Moreover, the role of mode of application of noise (additive/multiplicative) on the TODF profiles has also been meticulously analyzed. We have found that the shift of TODF peak position and change in TODF peak height sensitively depend on presence/absence of noise and also on its mode of application. Introduction of multiplicative noise causes greater deviation of TODF profiles from that of noise-free condition than using additive noise.


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