scholarly journals Development of a high-resolution cavity-beam position monitor

Author(s):  
Yoichi Inoue ◽  
Hitoshi Hayano ◽  
Yosuke Honda ◽  
Toshikazu Takatomi ◽  
Toshiaki Tauchi ◽  
...  
Author(s):  
Claire Simon ◽  
Michel Luong ◽  
Stéphane Chel ◽  
Olivier Napoly ◽  
Jorge Novo ◽  
...  

2013 ◽  
Vol 333-335 ◽  
pp. 2354-2357
Author(s):  
Bao Peng Wang ◽  
Yong Bin Leng ◽  
Wei Min Zhou ◽  
Lu Yang Yu ◽  
Ying Bing Yan

Based on the virtual instrument technology, a dedicated test system has been developed for cavity beam position monitor (CBPM). The system consists of commercial nanopositioning stage and its controller, the analog output DAQ card based on PXI and network analyzer. In the LABVIEW environment, software which implemented function of instrument control and data acquisition based on virtual instrument soft architecture (VISA) has been developed. Experimental results illustrated that the test system achieved positioning precision of sub micron which meets requirement of test of CBPM. Also it could serve CBPM signal processing system.


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