scholarly journals Run Rules-Based EWMA Charts for Efficient Monitoring of Profile Parameters

IEEE Access ◽  
2021 ◽  
Vol 9 ◽  
pp. 38503-38521
Author(s):  
Ali Yeganeh ◽  
Ali Reza Shadman ◽  
Ioannis S. Triantafyllou ◽  
Sandile Charles Shongwe ◽  
Saddam Akber Abbasi
Keyword(s):  
2009 ◽  
Vol 15 (4) ◽  
pp. 358-370 ◽  
Author(s):  
P. Castagliola ◽  
P. Maravelakis ◽  
S. Psarakis ◽  
K. Vännman
Keyword(s):  

2018 ◽  
Vol 138 ◽  
pp. 151-156 ◽  
Author(s):  
Hsing-Ming Chang ◽  
Yung-Ming Chang ◽  
Winnie H.W. Fu ◽  
Wan-Chen Lee
Keyword(s):  

Author(s):  
Chi-Hsiang Tsai ◽  
Sheng-You Wang ◽  
Chuei-Tin Chang ◽  
Shih-Hung Huang
Keyword(s):  

2020 ◽  
Vol 2020 ◽  
pp. 1-6
Author(s):  
Tingting Shan ◽  
Liusan Wu ◽  
Xuelong Hu

In order to monitor the process variance, this paper proposes a combined upper-sided synthetic S2 chart for monitoring the process standard deviation of a normally distributed process. This combined upper-sided synthetic S2 chart comprises a synthetic chart and an upper-sided S2 chart. The design and performance of the proposed chart are presented, and the steady-state average run length comparisons show that the combined upper-sided synthetic S2 chart outperforms the standard synthetic S2 chart as well as several run rules S2 charts, especially for larger shifts in the process variance.


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