EBIST: a novel test generator with built-in fault detection capability

Author(s):  
D.K. Pradhan ◽  
Chunsheng Liu ◽  
K. Chakraborty
2014 ◽  
Vol 16 (2) ◽  
pp. 22-30 ◽  
Author(s):  
Sanyogita Chaturvedi ◽  
◽  
A. Kulothungan

2014 ◽  
Vol 25 (5-7) ◽  
pp. 629-652 ◽  
Author(s):  
Paolo Arcaini ◽  
Angelo Gargantini ◽  
Elvinia Riccobene

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