This paper presents a novel algorithm for measuring the linewidth enhancement factor of semiconductor lasers and the optical feedback level factor in a semiconductor laser with an external cavity. The proposed approach is based on analysis of the self-mixing phase equation to deduce equations for finding parameters given only knowledge of the perturbed phase. The effectiveness of the method has been validated with accuracy of 8.6%and 1.7% for 'C' and alpha respectively while covering all feedback regimes.
This paper presents a novel algorithm for measuring the linewidth enhancement factor of semiconductor lasers and the optical feedback level factor in a semiconductor laser with an external cavity. The proposed approach is based on analysis of the self-mixing phase equation to deduce equations for finding parameters given only knowledge of the perturbed phase. The effectiveness of the method has been validated with accuracy of 8.6%and 1.7% for 'C' and alpha respectively while covering all feedback regimes.
An analytical method for estimation of parameters of Self Mixing Interferometric phase equation over all feedback regimes