IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

Mapping Intimacies ◽

10.1109/ieeestd.2014.6849913 ◽

2014 ◽

Keyword(s):

Low Voltage ◽

Test Methods ◽

Standard Test ◽

Data Communications ◽

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IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

10.1109/ieeestd.2000.91945 ◽

2000 ◽

Keyword(s):

Low Voltage ◽

Test Methods ◽

Standard Test ◽

Data Communications ◽

Download Full-text

IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

10.1109/ieeestd.1992.101081 ◽

1991 ◽

Keyword(s):

Low Voltage ◽

Test Methods ◽

Standard Test ◽

Data Communications ◽

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IEEE Standard Test Methods for Low-Voltage Gas-Tube Surge-Protective Device Components

10.1109/ieeestd.2006.261414 ◽

2006 ◽

Keyword(s):

Low Voltage ◽

Test Methods ◽

Standard Test ◽

Protective Device ◽

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IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types)

10.1109/ieeestd.2005.95941 ◽

2005 ◽

Keyword(s):

Low Voltage ◽

Test Methods ◽

Standard Test ◽

Air Gap ◽

Protective Device ◽

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IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components

10.1109/ieeestd.2010.5567080 ◽

2010 ◽

Keyword(s):

Test Methods ◽

Standard Test ◽

Protective Device ◽

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IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices (Excluding Valve and Expulsion Type Devices)

10.1109/ieeestd.1981.81017 ◽

1981 ◽

Keyword(s):

Low Voltage ◽

Standard Test ◽

Air Gap ◽

Protective Devices ◽

Test Specifications ◽

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IEEE Standard Specifications for Surge Protectors Used in Low-Voltage Data, Communications,and Signaling Circuits

10.1109/ieeestd.2009.5357525 ◽

2009 ◽

Keyword(s):

Low Voltage ◽

Data Communications ◽

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IEEE Standard Specifications for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

10.1109/ieeestd.1997.84240 ◽

1997 ◽

Keyword(s):

Low Voltage ◽

Data Communications ◽

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IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1

10.1109/ieeestd.2018.8577048 ◽

2018 ◽

Keyword(s):

Test Methods ◽

Standard Test ◽

Protective Device ◽

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IEEE Standard Test Specifications for Surge Protective Devices for Low Voltage AC Power Circuits

10.1109/ieeestd.2000.92290 ◽

2000 ◽

Keyword(s):

Low Voltage ◽

Standard Test ◽

Protective Devices ◽

Test Specifications ◽

Ac Power ◽

Ieee Standard ◽

Download Full-text