Lifetime Tests and Junction-Temperature Measurement of InGaN Light-Emitting Diodes Using Patterned Sapphire Substrates
2007 ◽
Vol 25
(2)
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pp. 591-596
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2019 ◽
Vol 34
(11)
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pp. 10414-10424
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2012 ◽
Keyword(s):
2013 ◽
Vol 34
(9)
◽
pp. 1172-1174
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Keyword(s):