Lifetime Tests and Junction-Temperature Measurement of InGaN Light-Emitting Diodes Using Patterned Sapphire Substrates

2007 ◽  
Vol 25 (2) ◽  
pp. 591-596 ◽  
Author(s):  
P. C. Tsai ◽  
Ricky W. Chuang ◽  
Y. K. Su
Micromachines ◽  
2018 ◽  
Vol 9 (12) ◽  
pp. 622 ◽  
Author(s):  
Wen-Yang Hsu ◽  
Yuan-Chi Lian ◽  
Pei-Yu Wu ◽  
Wei-Min Yong ◽  
Jinn-Kong Sheu ◽  
...  

Micron-sized patterned sapphire substrates (PSS) are used to improve the performance of GaN-based light-emitting diodes (LEDs). However, the growth of GaN is initiated not only from the bottom c-plane but also from the sidewall of the micron-sized patterns. Therefore, the coalescence of these GaN crystals creates irregular voids. In this study, two kinds of nucleation layers (NL)—ex-situ AlN NL and in-situ GaN NL—were used, and the growth of sidewall GaN was successfully suppressed in both systems by modifying the micron-sized PSS surface.


2019 ◽  
Vol 34 (11) ◽  
pp. 10414-10424
Author(s):  
Ze-Hui Liu ◽  
Jia-En Huang ◽  
Yu-Lin Gao ◽  
Zi-Quan Guo ◽  
Yue Lin ◽  
...  

2011 ◽  
Vol 4 (6) ◽  
pp. 062102 ◽  
Author(s):  
Chien-Chih Kao ◽  
Yan-Kuin Su ◽  
Yi-Ta Hsieh ◽  
Yung-Chun Lee ◽  
Chiao-Yang Cheng ◽  
...  

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