Gated-Clock Design of Linear-Feedback Shift Registers

2008 ◽  
Vol 55 (6) ◽  
pp. 546-550 ◽  
Author(s):  
W. Aloisi ◽  
R. Mita
Keyword(s):  
Linear Feedback ◽  
Linear Feedback Shift Registers ◽  
Feedback Shift Registers ◽  
Gated Clock

scholarly journals What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

2017 ◽  
Vol 10 (04) ◽  
pp. 710-717
Author(s):  
A. Ahmad ◽  
D. Al Abri ◽  
S. S. Al Busaidi ◽  
M. M. Bait-Suwailam
Keyword(s):  
Linear Feedback ◽  
Test Sequence ◽  
Linear Feedback Shift Registers ◽  
Random Test ◽  
Signature Analyzer ◽  
Simulation Results ◽  
Feedback Shift Registers ◽  
Self Test ◽  
Sequence Generator ◽  
Feedback Connections

The authors show that in a Built-In Self-Test (BIST) technique, based on linear-feedback shift registers, when the feedback connections in pseudo-random test-sequence generator and signature analyzer are images of each other and corresponds to primitive characteristic polynomial then behaviors of faults masking remains identical. The simulation results of single stuck-at faults show how the use of such feedback connections in pseudo-random test-sequence generator and signature analyzer yields to mask the same faults.

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