What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology
2017 ◽
Vol 10
(04)
◽
pp. 710-717
Keyword(s):
The authors show that in a Built-In Self-Test (BIST) technique, based on linear-feedback shift registers, when the feedback connections in pseudo-random test-sequence generator and signature analyzer are images of each other and corresponds to primitive characteristic polynomial then behaviors of faults masking remains identical. The simulation results of single stuck-at faults show how the use of such feedback connections in pseudo-random test-sequence generator and signature analyzer yields to mask the same faults.
2014 ◽
Vol 30
(1)
◽
pp. 77-85
◽
Keyword(s):
2014 ◽
Vol 11
(2)
◽
pp. 1
◽
1967 ◽
Vol 13
(1)
◽
pp. 119-120
2008 ◽
Vol 55
(6)
◽
pp. 546-550
◽
Keyword(s):