Detection of Deep-Levels in Doped Silicon Nanowires Using Low-Frequency Noise Spectroscopy
2013 ◽
Vol 60
(12)
◽
pp. 4206-4212
◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2000 ◽
Vol 37
(6)
◽
pp. 966
◽
Keyword(s):
2020 ◽
Vol 67
(2)
◽
pp. 547-551
◽
Keyword(s):
1994 ◽
Vol 41
(11)
◽
pp. 2188-2197
◽
2014 ◽
Vol 13
(6)
◽
pp. 1176-1180
◽
Keyword(s):
1999 ◽
Vol 46
(5)
◽
pp. 968-974
◽
Keyword(s):