Evaluation of deep levels in In0.53Ga0.47As and GaAs0.5Sb0.5 using low-frequency noise and RTS noise characterization

2011 ◽  
Vol 9 (2) ◽  
pp. 251-254 ◽  
Author(s):  
Wenjie Chen ◽  
Jinrong Yuan ◽  
Archie Holmes ◽  
Patrick Fay
Keyword(s):  
Low Frequency ◽  
Deep Levels ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characterization ◽  
Rts Noise

Low-Frequency Noise Characterization in GaN HEMTs: Investigation of Deep Levels and Their Physical Properties

2017 ◽  
Vol 38 (8) ◽  
pp. 1109-1112 ◽  
Author(s):  
Nandha Kumar Subramani ◽  
Julien Couvidat ◽  
Ahmad Al Hajjar ◽  
Jean-Christophe Nallatamby ◽  
Didier Floriot ◽  
...  
Keyword(s):  
Physical Properties ◽  
Low Frequency ◽  
Deep Levels ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemts ◽  
Noise Characterization

Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

2004 ◽  
Author(s):  
Jean-Guy Tartarin ◽  
Geoffroy Soubercaze-Pun ◽  
Abdelali Rennane ◽  
Laurent Bary ◽  
Robert Plana ◽  
...  
Keyword(s):  
Technology Assessment ◽  
Low Frequency ◽  
Failure Prediction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemt ◽  
Noise Characterization

Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization

2017 ◽  
Vol 178 ◽  
pp. 17-20 ◽  
Author(s):  
Rodrigo Trevisoli Doria ◽  
Renan Trevisoli ◽  
Michelly de Souza ◽  
Sylvain Barraud ◽  
Maud Vinet ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Substrate Bias ◽  
Low Frequency Noise ◽  
Bias Effect ◽  
Nanowire Transistors ◽  
Noise Characterization

scholarly journals Inkjet-printed graphene Hall mobility measurements and low-frequency noise characterization

Nanoscale ◽  
2020 ◽  
Vol 12 (12) ◽  
pp. 6708-6716 ◽  
Author(s):  
Gabriele Calabrese ◽  
Lorenzo Pimpolari ◽  
Silvia Conti ◽  
Fabrice Mavier ◽  
Subimal Majee ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hall Mobility ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characterization

Inkjet printed graphene is in-depth investigated by means of Hall mobility measurements, low-temperature magnetoresistance analysis, and low frequency noise characterization.

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