Introduction to the Special Issue on Reframing Confederate Monuments: Memory, Power, and Identity

Social Science Quarterly ◽

10.1111/ssqu.12960 ◽

2021 ◽

Author(s):

Jocelyn J. Evans ◽

William B. Lees

Keyword(s):

Special Issue ◽

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE Transactions on Electron Devices ◽

10.1109/ted.2018.2881854 ◽

2019 ◽

Vol 66 (2) ◽

pp. 1127-1127

Keyword(s):

Special Issue ◽

Memory Power ◽

Electron Devices ◽

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE Transactions on Electron Devices ◽

10.1109/ted.2018.2860881 ◽

2018 ◽

Vol 65 (9) ◽

pp. 4025-4025

Keyword(s):

Special Issue ◽

Memory Power ◽

Electron Devices ◽

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE Transactions on Electron Devices ◽

10.1109/ted.2018.2874900 ◽

2018 ◽

Vol 65 (12) ◽

pp. 5554-5554

Keyword(s):

Special Issue ◽

Memory Power ◽

Electron Devices ◽

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE Transactions on Electron Devices ◽

10.1109/ted.2018.2867396 ◽

2018 ◽

Vol 65 (10) ◽

pp. 4734-4734

Keyword(s):

Special Issue ◽

Memory Power ◽

Electron Devices ◽

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE Journal of Photovoltaics ◽

10.1109/jphotov.2019.2898395 ◽

2019 ◽

Vol 9 (2) ◽

pp. 578-578

Keyword(s):

Special Issue ◽

Memory Power ◽

Electron Devices ◽

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE Transactions on Electron Devices ◽

10.1109/ted.2018.2873929 ◽

2018 ◽

Vol 65 (11) ◽

pp. 5222-5222

Keyword(s):

Special Issue ◽

Memory Power ◽

Electron Devices ◽

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2018.2873888 ◽

2018 ◽

Vol 31 (4) ◽

pp. 545-545

Keyword(s):

Special Issue ◽

Memory Power ◽

Electron Devices ◽

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE Transactions on Electron Devices ◽

10.1109/ted.2018.2874914 ◽

2019 ◽

Vol 66 (1) ◽

pp. 834-834

Keyword(s):

Special Issue ◽

Memory Power ◽

Electron Devices ◽

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE Transactions on Electron Devices ◽

10.1109/ted.2018.2856678 ◽

2018 ◽

Vol 65 (8) ◽

pp. 3582-3582

Keyword(s):

Special Issue ◽

Memory Power ◽

Electron Devices ◽

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Special Issue Tackles SLI

ASHA Leader ◽

10.1044/leader.rib3.19102014.14 ◽

2014 ◽

Vol 19 (10) ◽

pp. 14-14

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