Combination of 3-D deformation and shape measurement by electronic speckle-pattern interferometry for quantitative strain- stress analysis

Shape Measurement ◽

Strain Stress

Shape Measurement Based on Phaseshifting Electronic Speckle Pattern Interferometry

ACTA PHOTONICA SINICA ◽

10.3788/gzxb20103911.2045 ◽

2010 ◽

Vol 39 (11) ◽

pp. 2045-2048

Author(s):

赵瑞冬 ZHAO Ruidong ◽

孙平 SUN Ping

Keyword(s):

Speckle Pattern ◽

Phase Shifting ◽

Automated Mode Shape Measurement By A Modulated-Fringe Technique Using Electronic Speckle Pattern Interferometry

10.1117/12.947676 ◽

1988 ◽

Cited By ~ 1

Author(s):

Paul S. Sherman ◽

Vernon M. Fernandez ◽

Yau Y. Hung

Keyword(s):

Mode Shape ◽

Speckle Pattern ◽

Shape measurement by carrier modulation in electronic speckle pattern interferometry

Optoelectronics Letters ◽

10.1007/s11801-008-7127-2 ◽

2008 ◽

Vol 4 (3) ◽

pp. 223-226

Author(s):

Ping Sun ◽

Zhen-xian Huang ◽

Fei Liu

Keyword(s):

Speckle Pattern ◽

Pulsed Electronic Speckle Pattern Interferometry In Experimental Stress Analysis

10.1117/12.943507 ◽

1988 ◽

Author(s):

Richard W. Preater

Keyword(s):

Stress Analysis ◽

Speckle Pattern ◽

Experimental Stress ◽

Experimental Stress Analysis

Strain/stress measurements using electronic speckle pattern interferometry

10.1117/12.334340 ◽

1998 ◽

Cited By ~ 3

Author(s):

Tilo Pfeifer ◽

Horst K. Mischo ◽

Andreas Ettemeyer ◽

Zhiguo Wang ◽

Ronny Wegner

Keyword(s):

Speckle Pattern ◽

Stress Measurements ◽

Strain Stress

Multiwavelength electronic speckle pattern interferometry for surface shape measurement

Applied Optics ◽

10.1364/ao.46.002624 ◽

2007 ◽

Vol 46 (14) ◽

pp. 2624 ◽

Cited By ~ 13

Author(s):

Eduardo A. Barbosa ◽

Antonio C. L. Lino

Keyword(s):

Speckle Pattern ◽

Surface Shape ◽

Shape measurement by endoscopes electronic-speckle-pattern interferometry with a two-wavelength method

10.1117/12.516622 ◽

2003 ◽

Author(s):

Bjorn Kemper ◽

Jochen Kandulla ◽

Sabine Knoche ◽

Gert von Bally

Keyword(s):

Speckle Pattern ◽

Three-step electronic speckle pattern interferometry method with arbitrary phase shifts of reference wave

Information extraction and processing ◽

10.15407/vidbir2019.47.054 ◽

2019 ◽

Vol 2019 (47) ◽

pp. 54-58

Author(s):

L.I. Muravsky ◽

Keyword(s):

Speckle Pattern ◽

Phase Shifts ◽

Reference Wave ◽

Arbitrary Phase ◽

Interferometry Method

Electronic Speckle Pattern Interferometry

Measurement of In-Plane Strain with Shearography and Electronic Speckle Pattern Interferometry for Composite Materials

2014 International Symposium on Optomechatronic Technologies ◽

10.1109/isot.2014.52 ◽

2014 ◽

Author(s):

Amalia Martinez-Garcia ◽

Juan-Antonio Rayas-Alvarez ◽

Raul Cordero

Keyword(s):

Composite Materials ◽

Plane Strain ◽

Speckle Pattern ◽

Electronic speckle pattern interferometry of residual stress measurement using hole-indentation method

10.1117/12.621936 ◽

2005 ◽

Author(s):

C. N. Sim ◽

Cho Jui Tay ◽

L. Cheng

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Speckle Pattern ◽

Residual Stress Measurement ◽

Indentation Method