Shape and deformation measurements of rough surfaces by phase-shifting digital holography

In digital holography recording as reconstruction of holograms are performed digitally by modern photonic devices to increase of optical non-contacting measurements of various kinds of surfaces including both specular and rough surfaces. In this article we discusses these features of digital holography using phase shifting techniques that has much extended its capabilities. Full Text: PDF ReferencesG. Bruning, D.R. Herriott, J.E. Gallagher, D.P. Rosenfeld, A.D. White, D.J. Brangaccio, "Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses", Appl. Opt. 13, 2693 (1974). CrossRef I. Yamaguchi, T. Zhang, "Phase-shifting digital holography", Opt. Lett. 22, 1268 (1997). CrossRef F. Zhang, I. Yamaguchi, L.P. Yaroslavsky, "Algorithm for reconstruction of digital holograms with adjustable magnification", Opt. Lett. 29, 1668 (2004). CrossRef I. Yamaguchi, "Holography, speckle, and computers", Optics and Lasers in Engineering 39, 411 (2003). CrossRef I. Yamaguchi, M. Yokota, "Speckle noise suppression in measurement by phase-shifting digital holography", Opt. Eng. 48 085602 (2009). CrossRef I. Yamaguchi, J. Kato, S. Ohta, "Surface Shape Measurement by Phase-Shifting Digital Holography", Opt. Rev. 8, 85 (2001). CrossRef I. Yamaguchi, J. Kato, H. Matsuzaki, "Measurement of surface shape and deformation by phase-shifting image digital holography", Opt. Eng. 42, 1267 (2003). CrossRef F. Zhang, J.D.R. Valera, I. Yamaguchi, M. Yokota, G. Mills, "Vibration Analysis by Phase Shifting Digital Holography", Opt. Rev. 11, 5 (2004). CrossRef

Surface Reconstruction of Microscale Objects Based on Grid-Patterned Structured-Light Measurements

A structured-light projection system was designed for microscale objects with surface heights that ranged from tens to hundreds of microns. The system was composed of a universal projector and microscope system that supported editing the attributes of structured-light patterns in real-time and was capable of projecting microscale patterns. On this basis, reconstructing the metal surfaces of microscale objects based on grid patterns of structured light was investigated, the internal and external parameters of microscope vision and projection systems were calibrated, and an image algorithm for grid-node detection was designed. The results indicated that the proposed method successfully reconstructed the three-dimensional (3D) surface of microscale objects, and the reconstruction results were consistent with the original surfaces. With 95% confidence, the reconstruction precision in the X- and Y-directions was approximately ±4.0 μm and in the Z-direction was approximately ±7.5 μm. The designed system and the proposed method were suitable for 3D-shape measurement of microstructures in microscopic fields and can be adapted to meet a broader range of applications, as compared to current methods.