Multiwavelength electronic speckle pattern interferometry for surface shape measurement

Applied Optics ◽

10.1364/ao.46.002624 ◽

2007 ◽

Vol 46 (14) ◽

pp. 2624 ◽

Author(s):

Eduardo A. Barbosa ◽

Antonio C. L. Lino

Keyword(s):

Speckle Pattern ◽

Surface Shape ◽

Electronic Speckle Pattern Interferometry ◽

Shape Measurement

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Shape Measurement Based on Phaseshifting Electronic Speckle Pattern Interferometry

ACTA PHOTONICA SINICA ◽

10.3788/gzxb20103911.2045 ◽

2010 ◽

Vol 39 (11) ◽

pp. 2045-2048

Author(s):

赵瑞冬 ZHAO Ruidong ◽

孙平 SUN Ping

Keyword(s):

Speckle Pattern ◽

Phase Shifting ◽

Electronic Speckle Pattern Interferometry ◽

Shape Measurement

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Automated Mode Shape Measurement By A Modulated-Fringe Technique Using Electronic Speckle Pattern Interferometry

10.1117/12.947676 ◽

1988 ◽

Author(s):

Paul S. Sherman ◽

Vernon M. Fernandez ◽

Yau Y. Hung

Keyword(s):

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Shape Measurement

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Combination of 3-D deformation and shape measurement by electronic speckle-pattern interferometry for quantitative strain- stress analysis

Optical Engineering ◽

10.1117/1.602354 ◽

2000 ◽

Vol 39 (1) ◽

pp. 212 ◽

Author(s):

Andreas Ettemeyer

Keyword(s):

Stress Analysis ◽

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Shape Measurement ◽

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Shape measurement by carrier modulation in electronic speckle pattern interferometry

Optoelectronics Letters ◽

10.1007/s11801-008-7127-2 ◽

2008 ◽

Vol 4 (3) ◽

pp. 223-226

Author(s):

Ping Sun ◽

Zhen-xian Huang ◽

Fei Liu

Keyword(s):

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Shape Measurement

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Shape measurement by endoscopes electronic-speckle-pattern interferometry with a two-wavelength method

10.1117/12.516622 ◽

2003 ◽

Author(s):

Bjorn Kemper ◽

Jochen Kandulla ◽

Sabine Knoche ◽

Gert von Bally

Keyword(s):

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Shape Measurement

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Three-step electronic speckle pattern interferometry method with arbitrary phase shifts of reference wave

Information extraction and processing ◽

10.15407/vidbir2019.47.054 ◽

2019 ◽

Vol 2019 (47) ◽

pp. 54-58

Author(s):

L.I. Muravsky ◽

Keyword(s):

Speckle Pattern ◽

Phase Shifts ◽

Reference Wave ◽

Electronic Speckle Pattern Interferometry ◽

Arbitrary Phase ◽

Interferometry Method

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Measurement of In-Plane Strain with Shearography and Electronic Speckle Pattern Interferometry for Composite Materials

2014 International Symposium on Optomechatronic Technologies ◽

10.1109/isot.2014.52 ◽

2014 ◽

Author(s):

Amalia Martinez-Garcia ◽

Juan-Antonio Rayas-Alvarez ◽

Raul Cordero

Keyword(s):

Composite Materials ◽

Plane Strain ◽

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry

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Electronic speckle pattern interferometry of residual stress measurement using hole-indentation method

10.1117/12.621936 ◽

2005 ◽

Author(s):

C. N. Sim ◽

Cho Jui Tay ◽

L. Cheng

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Speckle Pattern ◽

Residual Stress Measurement ◽

Electronic Speckle Pattern Interferometry ◽

Indentation Method

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Thermal strain analysis of composite materials by electronic speckle pattern interferometry

KSME International Journal ◽

10.1007/bf03185649 ◽

2000 ◽

Vol 14 (5) ◽

pp. 477-482 ◽

Author(s):

Koung Suk Kim ◽

Wan Shik Jang ◽

Myung Seak Hong ◽

Ki Soo Kang ◽

Hyun Chul Jung ◽

...

Keyword(s):

Composite Materials ◽

Speckle Pattern ◽

Thermal Strain ◽

Strain Analysis ◽

Electronic Speckle Pattern Interferometry

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Stress-strain curves of flip-chip solder balls based on finite-element modeling of thermal displacements measured by electronic speckle pattern interferometry

Journal of Electronic Materials ◽

10.1007/s11664-003-0030-5 ◽

2003 ◽

Vol 32 (11) ◽

pp. 1322-1329 ◽

Author(s):

Baik-Woo Lee ◽

Ju-Young Kim ◽

Dongil Kwon

Keyword(s):

Finite Element ◽

Finite Element Modeling ◽

Flip Chip ◽

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Stress Strain ◽

Element Modeling ◽

Solder Balls ◽

Thermal Displacements

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