3-D super-resolution localization microscopy using deep-learning method

Author(s):  
Mengyang Lu ◽  
Tianyang Zhou ◽  
Xin Liu
2020 ◽  
Author(s):  
Anish Mukherjee

The quality of super-resolution images largely depends on the performance of the emitter localization algorithm used to localize point sources. In this article, an overview of the various techniques which are used to localize point sources in single-molecule localization microscopy are discussed and their performances are compared. This overview can help readers to select a localization technique for their application. Also, an overview is presented about the emergence of deep learning methods that are becoming popular in various stages of single-molecule localization microscopy. The state of the art deep learning approaches are compared to the traditional approaches and the trade-offs of selecting an algorithm for localization are discussed.


2019 ◽  
Vol 64 ◽  
pp. 132-141 ◽  
Author(s):  
Can Zhao ◽  
Muhan Shao ◽  
Aaron Carass ◽  
Hao Li ◽  
Blake E. Dewey ◽  
...  

2018 ◽  
Author(s):  
Marcel Štefko ◽  
Baptiste Ottino ◽  
Kyle M. Douglass ◽  
Suliana Manley

Super-resolution fluorescence microscopy improves spatial resolution, but this comes at a loss of image throughput and presents unique challenges in identifying optimal acquisition parameters. Microscope automation routines can offset these drawbacks, but thus far have required user inputs that presume a priori knowledge about the sample. Here, we develop a flexible illumination control system for localization microscopy comprised of two interacting components that require no sample-specific inputs: a self-tuning controller and a deep learning molecule density estimator that is accurate over an extended range. This system obviates the need to fine-tune parameters and demonstrates the design of modular illumination control for localization microscopy.


2018 ◽  
Vol 36 (5) ◽  
pp. 460-468 ◽  
Author(s):  
Wei Ouyang ◽  
Andrey Aristov ◽  
Mickaël Lelek ◽  
Xian Hao ◽  
Christophe Zimmer

Author(s):  
Ruud JG van Sloun ◽  
Oren Solomon ◽  
Matthew Bruce ◽  
Zin Z Khaing ◽  
Hessel Wijkstra ◽  
...  

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 117759-117769
Author(s):  
Yuzhang Chen ◽  
Kangli Niu ◽  
Zhangfan Zeng ◽  
Yongcai Pan

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