Multiple pitch estimation using comb filters considering overlap of frequency components

2014 ◽  
Vol 136 (4) ◽  
pp. 2215-2215
Author(s):  
Kyohei Tabata ◽  
Ryo Tanaka ◽  
Hiroki Tanji ◽  
Takahiro Murakami ◽  
Yoshihisa Ishida
Keyword(s):  
Pitch Estimation ◽  
Comb Filters ◽  
Frequency Components

Multiple comb filters and autocorrelation of the multi-scale product for multi-pitch estimation

2017 ◽  
Vol 120 ◽  
pp. 45-53 ◽  
Author(s):  
Jihen Zeremdini ◽  
Mohamed Anouar Ben Messaoud ◽  
Aicha Bouzid
Keyword(s):  
Pitch Estimation ◽  
Multi Scale ◽  
Comb Filters

scholarly journals Pitch Estimation of Solo and Duet Songs using Double Comb Filters

2001 ◽  
Vol 121 (12) ◽  
pp. 1853-1859
Author(s):  
Michiru Yamaguchi ◽  
Taeko Miwa ◽  
Tsutomu Saitou ◽  
Yoshiaki Tadokoro
Keyword(s):  
Pitch Estimation ◽  
Comb Filters

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

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