Determination of the conductance and thickness of semiconductor wafers and nanometer layers with the use of one-dimensional microwave photonic crystals
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2007 ◽
Vol 278
(2)
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pp. 334-339
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2016 ◽
Vol 61
(1)
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pp. 42-49
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2019 ◽
2011 ◽
Vol 70
(14)
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pp. 1305-1313
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