Theory of Isoperibol Calorimetry for Laser Power and Energy Measurement

Author(s):  
K. Firth ◽  
M. B. Davies

The use of photoelectric devices for measuring the output power and energy of pulsed and c.w. lasers is well established. This paper describes the principles, limitations, and advantages of the method. The precautions which must be taken to ensure accurate and reproducible results are also discussed in some detail.


Measurement ◽  
2021 ◽  
Vol 172 ◽  
pp. 108961
Author(s):  
Aniket Babuta ◽  
Bhavna Gupta ◽  
Abhimanyu Kumar ◽  
Souvik Ganguli

2008 ◽  
Vol 17 (03) ◽  
pp. 399-421 ◽  
Author(s):  
RANJITH KUMAR ◽  
ZHIYU LIU ◽  
VOLKAN KURSUN

Computer-aided design (CAD) tools are frequently employed to verify the design objectives before the fabrication of an integrated circuit. An important circuit parameter that requires accurate characterization is the power consumption due to the strict constraints on the acceptable power envelope of integrated systems. Circuit simulators typically provide built-in functions to measure the power consumption. However, the accuracy of the measured power is mostly overlooked since the approximations and the methodologies used by the existing built-in power estimation tools are not well documented. The research community tends to assume that the built-in functions provide accurate power figures. This blind-trust in the CAD tools, however, may lead to gross errors in power estimation. A generic methodology to accurately measure the power and energy consumption with the circuit simulators is described in this paper. An equation to calculate the device power consumption based on the different current conduction paths in a MOSFET is presented. An expression for the total power consumption of a complex circuit is derived by explicitly considering the different circuit terminals including the inputs, the outputs, and the body-contacts. Results indicate that the power measurements with the built-in functions of widely used commercial circuit simulators can introduce significant errors in a 65 nm CMOS technology. For deeply scaled nano-CMOS circuits, a conscious power and energy measurement with the proposed explicit methodology is recommended for an accurate pre-fabrication circuit characterization.


2012 ◽  
Vol 40 (12) ◽  
pp. 963
Author(s):  
Katsumi ISHII

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