A method for the measurement of phase with high accuracy in intensity modulated optical imaging

Author(s):  
I Nissilä ◽  
K Kotilahti ◽  
T Noponen ◽  
T Katila
Small ◽  
2021 ◽  
Vol 17 (2) ◽  
pp. 2170005
Author(s):  
Dewen Ye ◽  
Mingxi Li ◽  
Yuanyuan Xie ◽  
Bo Chen ◽  
Yuexia Han ◽  
...  

2015 ◽  
Vol 5 (5) ◽  
pp. 1422-1427 ◽  
Author(s):  
Ricky B. Dunbar ◽  
Augustin Barbe ◽  
Christopher J. Fell

Small ◽  
2020 ◽  
pp. 2005474
Author(s):  
Dewen Ye ◽  
Mingxi Li ◽  
Yuanyuan Xie ◽  
Bo Chen ◽  
Yuexia Han ◽  
...  

2016 ◽  
Vol 45 (12) ◽  
pp. 1211002
Author(s):  
李航 LI Hang ◽  
颜昌翔 YAN Chang-xiang ◽  
邵建兵 SHAO Jian-bing ◽  
王小朋 WANG Xiao-peng

Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.


2004 ◽  
Vol 171 (4S) ◽  
pp. 289-289
Author(s):  
Gabri van der Pluijm ◽  
Antoinette Wetterwald ◽  
George N. Thalmann ◽  
Guus Lycklama A. Nijeholt ◽  
Rob Pelger ◽  
...  

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