Opitimization of a Multifrequency Eddy-Current Test System Concerning the Defect Detection Sensibility

Author(s):  
R Becker ◽  
K Betzold
1989 ◽  
Vol 22 (1) ◽  
pp. 40
Author(s):  
Institut Dr Förster GmbH

1989 ◽  
Vol 22 (1) ◽  
pp. 40
Author(s):  
Institut Dr Förster GmbH & Co KG

2013 ◽  
Author(s):  
Jürgen Schreiber ◽  
Ulana Cikalova ◽  
Susanne Hillmann ◽  
Norbert Meyendorf ◽  
Jochen Hoffmann

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