Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis

Mapping Intimacies ◽

10.3403/02704860 ◽

2002 ◽

Keyword(s):

High Resolution ◽

Chemical Analysis ◽

Auger Electron ◽

Chemical State ◽

Surface Chemical ◽

Surface Chemical Analysis ◽

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Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis

10.3403/02704860u ◽

2015 ◽

Keyword(s):

High Resolution ◽

Chemical Analysis ◽

Auger Electron ◽

Chemical State ◽

Surface Chemical ◽

Surface Chemical Analysis ◽

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Summary of ISO/TC 201 Standard XI. ISO 17974:2002?Surface chemical analysis?High-resolution Auger electron spectrometers?Calibration of energy scales for elemental and chemical-state analysis

Surface and Interface Analysis ◽

10.1002/sia.1529 ◽

2003 ◽

Vol 35 (3) ◽

pp. 327-328 ◽

Author(s):

M. P. Seah

Keyword(s):

High Resolution ◽

Chemical Analysis ◽

Auger Electron ◽

Chemical State ◽

Surface Chemical ◽

Surface Chemical Analysis ◽

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Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale

10.3403/03239681u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron ◽

Surface Chemical ◽

Intensity Scale ◽

X Ray ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale

10.3403/03267940 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

Intensity Scale ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction

10.3403/30184132u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

Charge Control ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

10.3403/30242215 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

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Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006—Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—methods used to determine peak intensities and information required when reporting results

Surface and Interface Analysis ◽

10.1002/sia.2533 ◽

2007 ◽

Vol 39 (5) ◽

pp. 464-466 ◽

Author(s):

C. J. Powell

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters

10.3403/03241445u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

Performance Parameters ◽

Instrumental Performance ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information

10.3403/30124280 ◽

2006 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Chemical Information ◽

Surface Chemical ◽

Surface Chemical Analysis

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