In order to identify projection light color information of the color structured light rapidly and accurately, this paper proposes a projection light color correction algorithm based on “Dichromatic Reflection Model”(DRM). This algorithm revises the effect on projection light color which caused by object surface’s color and highlight, through estimating three-channel spectral reflectance of the object, separating specular and diffuse components. The experiment shows that the proposed method has more advantages than the color recognition of color structured light which based on DRM, such as high robustness, fast calculation and high accuracy.
Illumination factors such as shading, shadow, and highlight observed from object surfaces affect the appearance and analysis of natural color images. Invariant representations to these factors were presented in several ways. Most of these methods used the standard dichromatic reflection model that assumed inhomogeneous dielectric material. The standard model cannot describe metallic objects. This chapter introduces an illumination-invariant representation that is derived from the standard dichromatic reflection model for inhomogeneous dielectric and the extended dichromatic reflection model for homogeneous metal. The illumination color is estimated from two inhomogeneous surfaces to recover the surface reflectance of object without using a reference white standard. The overall performance of the invariant representation is examined in experiments using real-world objects including metals and dielectrics in detail. The feasibility of the representation for effective edge detection is introduced and compared with the state-of-the-art illumination-invariant methods.
Illumination Chromaticity Estimation Based on Dichromatic Reflection Model and Imperfect Segmentation
