Machine Vision Inspection Method of Mura Defect for TFT-LCD

2010 ◽  
Vol 46 (12) ◽  
pp. 13 ◽  
Author(s):  
Xin BI
Keyword(s):  
Machine Vision ◽  
Inspection Method ◽  
Vision Inspection ◽  
Machine Vision Inspection

Defect Inspection for SMD Inductors

2014 ◽  
Vol 635-637 ◽  
pp. 989-992
Author(s):  
Chun Li Chang ◽  
Wen Hong Wu ◽  
Rui Cian Weng ◽  
Chi Hung Hwang
Keyword(s):  
Machine Vision ◽  
High Frequency ◽  
Defect Inspection ◽  
Inspection Method ◽  
Electronic Products ◽  
Electrode Area ◽  
Vision Inspection ◽  
Defect Area ◽  
Machine Vision Inspection

This paper presents a machine vision inspection method for winding high frequency inductors, which affects the reliability and quality of the electronic products. This paper proposes how to quickly and correctly improve the quality of component detection, an important issue for surface mounted device (SMD) inductors manufacturers. SMD components easily damage the phenomenon of the electrode, and the brightness of the brightness of the damaged area of the electrode close to normal, not easy to be precise defect area separated from the electrode area.

Rotary Tray for Machine Vision Inspection of Whole Eggplant Fruit

2006 ◽  
Author(s):  
Naoshi Kondo ◽  
Junzo Kamata ◽  
Kazunori Ninomiya ◽  
Mitsuji Monta ◽  
K.C. Ting
Keyword(s):  
Machine Vision ◽  
Vision Inspection ◽  
Machine Vision Inspection
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