Progress in Crystal Growth and Characterization
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Published By Elsevier

0146-3535
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

MOMBE and MOVPE—A comparison of growth techniques

1989 ◽  
Vol 19 (1-2) ◽  
pp. 83-96 ◽  
Author(s):  
M. Weyers

Micromorphology of as-grown surfaces of crystals

1989 ◽  
Vol 19 (3) ◽  
pp. 189-245 ◽  
Author(s):  
K. Sangwal

Characterization of advanced epitaxial structures

1989 ◽  
Vol 19 (1-2) ◽  
pp. 51-62 ◽  
Author(s):  
B. Hamilton ◽  
A.R. Parker

Characterisation of structures grown by Movpe using x-ray diffraction

1989 ◽  
Vol 19 (4) ◽  
pp. 249-257 ◽  
Author(s):  
Mary Halliwell
Keyword(s):  
X Ray Diffraction ◽  
X Ray

Small-angle scattering of X-rays

1989 ◽  
Vol 18 ◽  
pp. 1-19 ◽  
Author(s):  
H.B. Stuhrmann
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
X Rays ◽  
Angle Scattering

New device concepts: The implications for MOVPE

1989 ◽  
Vol 19 (1-2) ◽  
pp. 107-114
Author(s):  
J.L. Beeby
Keyword(s):  
New Device

Recent advances in III–V compounds on silicon

1989 ◽  
Vol 19 (1-2) ◽  
pp. 21-37 ◽  
Author(s):  
M. Razeghi
Keyword(s):  
Recent Advances

Photo-induced organometallic processes in semiconductor surface technology

1989 ◽  
Vol 19 (1-2) ◽  
pp. 149-157 ◽  
Author(s):  
J. Haigh ◽  
K. Durose
Keyword(s):  
Semiconductor Surface
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