Progress in Crystal Growth and Characterization
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0146-3535

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Characterization of advanced epitaxial structures

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90012-9 ◽

1989 ◽

Vol 19 (1-2) ◽

pp. 51-62 ◽

Author(s):

B. Hamilton ◽

A.R. Parker

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Micromorphology of as-grown surfaces of crystals

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90005-1 ◽

1989 ◽

Vol 19 (3) ◽

pp. 189-245 ◽

Author(s):

K. Sangwal

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MOMBE and MOVPE—A comparison of growth techniques

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90014-2 ◽

1989 ◽

Vol 19 (1-2) ◽

pp. 83-96 ◽

Author(s):

M. Weyers

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New device concepts: The implications for MOVPE

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90016-6 ◽

1989 ◽

Vol 19 (1-2) ◽

pp. 107-114

Author(s):

J.L. Beeby

Keyword(s):

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Recent advances in III–V compounds on silicon

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90010-5 ◽

1989 ◽

Vol 19 (1-2) ◽

pp. 21-37 ◽

Author(s):

M. Razeghi

Keyword(s):

Recent Advances

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Characterisation of structures grown by Movpe using x-ray diffraction

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90001-4 ◽

1989 ◽

Vol 19 (4) ◽

pp. 249-257 ◽

Author(s):

Mary Halliwell

Keyword(s):

X Ray Diffraction ◽

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Small-angle scattering of X-rays

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90023-3 ◽

1989 ◽

Vol 18 ◽

pp. 1-19 ◽

Author(s):

H.B. Stuhrmann

Keyword(s):

Small Angle ◽

Small Angle Scattering ◽

X Rays ◽

Angle Scattering

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Metalorganic vapour phase epitaxy: Selected workshop topics

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90008-7 ◽

1989 ◽

Vol 19 (1-2) ◽

pp. i

Author(s):

Brian Mullin

Keyword(s):

Vapour Phase ◽

Vapour Phase Epitaxy ◽

Metalorganic Vapour Phase Epitaxy

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The characterization of modulated structures via their diffraction patterns

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90027-0 ◽

1989 ◽

Vol 18 ◽

pp. 139-204 ◽

Author(s):

R.L. Withers

Keyword(s):

Modulated Structures ◽

Diffraction Patterns

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Photo-induced organometallic processes in semiconductor surface technology

Progress in Crystal Growth and Characterization ◽

10.1016/0146-3535(89)90020-8 ◽

1989 ◽

Vol 19 (1-2) ◽

pp. 149-157 ◽

Author(s):

J. Haigh ◽

K. Durose

Keyword(s):

Semiconductor Surface

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