Characterization of Defects and Deep Levels for GaN Power Devices
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Index

2020 ◽  
pp. 1-3
Author(s):  
Tetsuo Narita ◽  
Tetsu Kachi

scholarly journals Front Matter

2020 ◽  
pp. i-xiv
Author(s):  
Tetsuo Narita ◽  
Tetsu Kachi

Combined APT and STEM Analyses

2020 ◽  
pp. 1-28
Author(s):  
Ashutosh Kumar ◽  
Tadakatsu Ohkubo

scholarly journals Introduction

2020 ◽  
pp. 1-24
Author(s):  
Tetsuo Narita ◽  
Tetsu Kachi

Deep Levels in GaN

2020 ◽  
pp. 1-36
Author(s):  
Tetsuo Narita ◽  
Yutaka Tokuda
Keyword(s):  
Deep Levels
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