Characterization of Defects and Deep Levels for GaN Power Devices
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9780735422698

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Methods of Analyzing Deep Levels in GaN

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_002 ◽

2020 ◽

pp. 1-22

Author(s):

Tetsuo Narita ◽

Yutaka Tokuda

Keyword(s):

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Index

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_index ◽

2020 ◽

pp. 1-3

Author(s):

Tetsuo Narita ◽

Tetsu Kachi

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Multiphoton Microscopy

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_007 ◽

2020 ◽

pp. 1-22

Author(s):

Tomoyuki Tanikawa

Keyword(s):

Multiphoton Microscopy

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Front Matter

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_frontmatter ◽

2020 ◽

pp. i-xiv

Author(s):

Tetsuo Narita ◽

Tetsu Kachi

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Structural Defects in Mg-Doped GaN: TEM Analysis

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_004 ◽

2020 ◽

pp. 1-28

Author(s):

Nobuyuki Ikarashi

Keyword(s):

Structural Defects ◽

Tem Analysis ◽

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Local Lattice Plane Orientation Mapping of Entire GaN Wafer

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_006 ◽

2020 ◽

pp. 1-12

Author(s):

Osami Sakata ◽

Jaemyung Kim

Keyword(s):

Lattice Plane ◽

Plane Orientation ◽

Orientation Mapping ◽

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Combined APT and STEM Analyses

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_005 ◽

2020 ◽

pp. 1-28

Author(s):

Ashutosh Kumar ◽

Tadakatsu Ohkubo

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Introduction

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_001 ◽

2020 ◽

pp. 1-24

Author(s):

Tetsuo Narita ◽

Tetsu Kachi

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Deep Levels in GaN

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_003 ◽

2020 ◽

pp. 1-36

Author(s):

Tetsuo Narita ◽

Yutaka Tokuda

Keyword(s):

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Future Challenges: Defects in GaN Power Devices due to Fabrication Processes

Characterization of Defects and Deep Levels for GaN Power Devices ◽

10.1063/9780735422698_008 ◽

2020 ◽

pp. 1-30

Author(s):

Tetsuo Narita ◽

Tetsu Kachi

Keyword(s):

Power Devices ◽

Future Challenges

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