High Quality Test Pattern Generation and Boolean Satisfiability
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Published By Springer US

9781441999757, 9781441999764
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Circuits and Testing

2012 ◽  
pp. 11-40
Author(s):  
Stephan Eggersglüß ◽  
Rolf Drechsler

Path Delay Fault Model

2012 ◽  
pp. 155-180
Author(s):  
Stephan Eggersglüß ◽  
Rolf Drechsler
Keyword(s):  
Fault Model ◽  
Path Delay ◽  
Delay Fault ◽  
Path Delay Fault

High Quality ATPG for Transition Faults

2012 ◽  
pp. 127-154
Author(s):  
Stephan Eggersglüß ◽  
Rolf Drechsler
Keyword(s):  
High Quality ◽  
Transition Faults

ATPG Based on Boolean Satisfiability

2012 ◽  
pp. 59-70 ◽  
Author(s):  
Stephan Eggersglüß ◽  
Rolf Drechsler
Keyword(s):  
Boolean Satisfiability

Circuit-Based Dynamic Learning

2012 ◽  
pp. 107-124
Author(s):  
Stephan Eggersglüß ◽  
Rolf Drechsler
Keyword(s):  
Dynamic Learning

Summary and Outlook

2012 ◽  
pp. 181-182
Author(s):  
Stephan Eggersglüß ◽  
Rolf Drechsler

Dynamic Clause Activation

2012 ◽  
pp. 73-106
Author(s):  
Stephan Eggersglüß ◽  
Rolf Drechsler

Introduction

2012 ◽  
pp. 1-8
Author(s):  
Stephan Eggersglüß ◽  
Rolf Drechsler

Boolean Satisfiability

2012 ◽  
pp. 41-57
Author(s):  
Stephan Eggersglüß ◽  
Rolf Drechsler
Keyword(s):  
Boolean Satisfiability
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