2008 IEEE International Test Conference
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TOTAL DOCUMENTS

183
(FIVE YEARS 0)

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20
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Published By IEEE

9781424424023
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Low-Cost Programmable Memory BIST Design for Multiple Memory Instances

2008 ◽  
Author(s):  
Chung-Fu Lin ◽  
Chia-Fu Huang ◽  
De-Chung Lu ◽  
Chih-Chiang Hsu ◽  
Wen-Tsung Chiu ◽  
...  
Keyword(s):  
Low Cost

Wireless Test Structure for Integrated Systems

2008 ◽  
Author(s):  
Ziad Noun ◽  
Philippe Cauvet ◽  
Marie-Lise Flottes ◽  
David Andreu ◽  
Serge Bernard
Keyword(s):  
Test Structure ◽  
Integrated Systems

Optical Diagnostics for IBM POWER6- Microprocessor

2008 ◽  
Author(s):  
P. Song ◽  
S. Ippolito ◽  
F. Stellari ◽  
J. Sylvestri ◽  
T. Diemoz ◽  
...  
Keyword(s):  
Optical Diagnostics

Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes

2008 ◽  
Author(s):  
B. Moore ◽  
M. Mangrum ◽  
C. Sellathamby ◽  
M. Reja ◽  
T. Weng ◽  
...  
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