Abstract
In the production of various devices, various problems can arise, leading to the appearance of defects, both explicit and latent. This may be due to both poor quality materials and imperfect technology. To identify defects, devices are tested. If the device uses a digital signal transmission at high frequencies, it is usually considered sufficient to check the functioning of the individual components using technological programs. But at high transmission frequencies, or due to defects, the digital signal is distorted, and in devices where there is no error control, violations of the signal integrity during transmission can lead to failures and failures. Moreover, under normal conditions, the signal can meet the requirements, and in difficult conditions, go beyond the permissible limits. If an individual instance of a device can be susceptible to such failures, this can be identified in more detail by examining the signals flowing through its circuits. The most obvious way requires an oscilloscope, on the screen of which a person looks at the parameters of such a signal, time and amplitude characteristics. This is a very slow operation, so optimization might be the next step. For example, the use of flying probes, or probes with commutation, recording and automatic comparison of oscillograms with the exemplary one. In any case, these tests require equipment operating at frequencies much higher than the circuit itself, which means that at high baud rates, such equipment starts to be expensive.
Methodology for Designing Hardware for Measuring Parameters of a Digital Signal
