1996 International Integrated Reliability Workshop Final Report
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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Hole trapping as the rate-limiting factor in LDD nMOSFET degradation

2002 ◽  
Author(s):  
A. Gupta ◽  
D.S. Sugiharto ◽  
C.Y. Yang ◽  
N. Matsuzaki ◽  
M. Minami ◽  
...  
Keyword(s):  
Limiting Factor ◽  
Hole Trapping ◽  
Rate Limiting

Effect of N/sub 2/O or NO annealing of wet oxide at different times on TDDB characteristics

2002 ◽  
Author(s):  
M.K. Mazumder ◽  
A. Teramoto ◽  
K. Kobayashi ◽  
M. Katsumata ◽  
Y. Mashiko ◽  
...  
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