Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems - TECPS 2017
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9781450351126

Author(s):  
Vaibhav Sharma ◽  
Taejoon Byun ◽  
Stephen McCamant ◽  
Sanjai Rayadurgam ◽  
Mats P. E. Heimdahl
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