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Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
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TOTAL DOCUMENTS
36
(FIVE YEARS 0)
H-INDEX
3
(FIVE YEARS 0)
Published By IEEE
0780319087
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The Keynote Address
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515817
◽
2005
◽
Author(s):
Ping Yang
Keyword(s):
Keynote Address
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Call to Participate in Second Interlaboratory Electromigration Experiment
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515850
◽
2005
◽
Author(s):
H.A. Schafft
◽
E.T. Achee
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Reliability Modeling and Simulation Discussion Group
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515843
◽
2005
◽
Author(s):
E. Rosenbaum
◽
K. Shenai
Keyword(s):
Modeling And Simulation
◽
Discussion Group
◽
Reliability Modeling
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BUILDING-IN RELIABILITY DISCUSSION GROUP: CUSTOMER/SUPPLIER RELATIONSHIPS
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515840
◽
2005
◽
Author(s):
W.K. Gladden
Keyword(s):
Discussion Group
◽
Supplier Relationships
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Wafer Level Reliability Utilization and Trends
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515842
◽
2005
◽
Cited By ~ 1
Author(s):
E.T. Achee
Keyword(s):
Wafer Level
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DEGRADATION OP OFF-STATE LEAKAGE IN PMOS TRANSISTORS UNDER HOT CARRIER INJECTION
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515828
◽
2005
◽
Author(s):
C.H.J. Huang
◽
T.A. Rost
◽
J.W. McPherson
Keyword(s):
Carrier Injection
◽
Hot Carrier
◽
Hot Carrier Injection
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Discussion Group Summary Report Qualification Elimination
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515841
◽
2005
◽
Author(s):
D.L. Erhart
Keyword(s):
Discussion Group
◽
Summary Report
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Improved electromigration test techniques of layered metal structures at wafer level
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515849
◽
2002
◽
Author(s):
H. Katto
Keyword(s):
Wafer Level
◽
Metal Structures
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Gate oxide reliability: the use of simulation to quantify important aspects of lifetime projection from TDDB data
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515834
◽
2002
◽
Cited By ~ 7
Author(s):
W.R. Hunter
Keyword(s):
Gate Oxide
◽
Oxide Reliability
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Correlation of lifetimes from CVS and RVS using the 1/E-model for thermally grown oxides on polysilicon
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
◽
10.1109/irws.1994.515836
◽
2002
◽
Cited By ~ 6
Author(s):
A. Martin
◽
P. O'Sullivan
◽
A. Mathewson
Keyword(s):
Thermally Grown Oxides
◽
Thermally Grown
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