Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
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Published By IEEE

0780319087

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The Keynote Address

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515817 ◽

2005 ◽

Author(s):

Ping Yang

Keyword(s):

Keynote Address

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Call to Participate in Second Interlaboratory Electromigration Experiment

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515850 ◽

2005 ◽

Author(s):

H.A. Schafft ◽

E.T. Achee

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BUILDING-IN RELIABILITY DISCUSSION GROUP: CUSTOMER/SUPPLIER RELATIONSHIPS

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515840 ◽

2005 ◽

Author(s):

W.K. Gladden

Keyword(s):

Discussion Group ◽

Supplier Relationships

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Reliability Modeling and Simulation Discussion Group

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515843 ◽

2005 ◽

Author(s):

E. Rosenbaum ◽

K. Shenai

Keyword(s):

Modeling And Simulation ◽

Discussion Group ◽

Reliability Modeling

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Wafer Level Reliability Utilization and Trends

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515842 ◽

2005 ◽

Cited By ~ 1

Author(s):

E.T. Achee

Keyword(s):

Wafer Level

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DEGRADATION OP OFF-STATE LEAKAGE IN PMOS TRANSISTORS UNDER HOT CARRIER INJECTION

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515828 ◽

2005 ◽

Author(s):

C.H.J. Huang ◽

T.A. Rost ◽

J.W. McPherson

Keyword(s):

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Discussion Group Summary Report Qualification Elimination

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515841 ◽

2005 ◽

Author(s):

D.L. Erhart

Keyword(s):

Discussion Group ◽

Summary Report

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Improved electromigration test techniques of layered metal structures at wafer level

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515849 ◽

2002 ◽

Author(s):

H. Katto

Keyword(s):

Wafer Level ◽

Metal Structures

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Gate oxide reliability: the use of simulation to quantify important aspects of lifetime projection from TDDB data

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515834 ◽

2002 ◽

Cited By ~ 7

Author(s):

W.R. Hunter

Keyword(s):

Gate Oxide ◽

Oxide Reliability

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Correlation of lifetimes from CVS and RVS using the 1/E-model for thermally grown oxides on polysilicon

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) ◽

10.1109/irws.1994.515836 ◽

2002 ◽

Cited By ~ 6

Author(s):

A. Martin ◽

P. O'Sullivan ◽

A. Mathewson

Keyword(s):

Thermally Grown Oxides ◽

Thermally Grown

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Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

The Keynote Address

Call to Participate in Second Interlaboratory Electromigration Experiment

BUILDING-IN RELIABILITY DISCUSSION GROUP: CUSTOMER/SUPPLIER RELATIONSHIPS

Reliability Modeling and Simulation Discussion Group

Wafer Level Reliability Utilization and Trends

DEGRADATION OP OFF-STATE LEAKAGE IN PMOS TRANSISTORS UNDER HOT CARRIER INJECTION

Discussion Group Summary Report Qualification Elimination

Improved electromigration test techniques of layered metal structures at wafer level

Gate oxide reliability: the use of simulation to quantify important aspects of lifetime projection from TDDB data

Correlation of lifetimes from CVS and RVS using the 1/E-model for thermally grown oxides on polysilicon

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
Latest Publications