Thermal Testing of Integrated Circuits
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Published By Springer US

9781441952875, 9781475736359

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Feasibility analysis and conclusions

Thermal Testing of Integrated Circuits ◽

10.1007/978-1-4757-3635-9_6 ◽

2002 ◽

pp. 185-199

Author(s):

Josep Altet ◽

Antonio Rubio

Keyword(s):

Feasibility Analysis

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Thermal monitoring of IC’s

Thermal Testing of Integrated Circuits ◽

10.1007/978-1-4757-3635-9_5 ◽

2002 ◽

pp. 139-183 ◽

Author(s):

Josep Altet ◽

Antonio Rubio

Keyword(s):

Thermal Monitoring

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Temperature as a test observable variable in ICs

Thermal Testing of Integrated Circuits ◽

10.1007/978-1-4757-3635-9_4 ◽

2002 ◽

pp. 97-138

Author(s):

Josep Altet ◽

Antonio Rubio

Keyword(s):

Observable Variable

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Introduction to the testing of integrated circuits

Thermal Testing of Integrated Circuits ◽

10.1007/978-1-4757-3635-9_1 ◽

2002 ◽

pp. 1-21

Author(s):

Josep Altet ◽

Antonio Rubio

Keyword(s):

Integrated Circuits

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Thermal analysis in integrated circuits

Thermal Testing of Integrated Circuits ◽

10.1007/978-1-4757-3635-9_3 ◽

2002 ◽

pp. 53-96

Author(s):

Josep Altet ◽

Antonio Rubio

Keyword(s):

Thermal Analysis ◽

Integrated Circuits

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Thermal transfer and thermal coupling in IC’s

Thermal Testing of Integrated Circuits ◽

10.1007/978-1-4757-3635-9_2 ◽

2002 ◽

pp. 23-51

Author(s):

Josep Altet ◽

Antonio Rubio

Keyword(s):

Thermal Coupling ◽

Thermal Transfer

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