2020 IEEE Physical Assurance and Inspection of Electronics (PAINE)
Latest Publications

TOTAL DOCUMENTS

17
(FIVE YEARS 17)

H-INDEX

1
(FIVE YEARS 1)

Published By IEEE

9781728161211
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Sample Mounting Methods for Precision Delayering of 130 nm Integrated Circuit Devices

2020 ◽  
Author(s):  
Jonathan Scholl ◽  
Yash Patel ◽  
Joshua Baur ◽  
Adam Kimura ◽  
Adam Waite ◽  
...  
Keyword(s):  
Integrated Circuit

From Silicon to Simulation: A Full Decomposition of a Fabricated 130 nm Serial Peripheral Interface for Establishing an Assurance Baseline Root-of-Trust

2020 ◽  
Author(s):  
Adam G. Kimura ◽  
Adam R. Waite ◽  
Jon Scholl ◽  
James Schaffranek ◽  
Matt Sutter ◽  
...  
Keyword(s):  
Serial Peripheral Interface ◽  
Root Of Trust

Tracking Cloned Electronic Components using a Consortium-based Blockchain Infrastructure

2020 ◽  
Author(s):  
Jason Vosatka ◽  
Andrew Stern ◽  
M.M. Hossain ◽  
Fahim Rahman ◽  
Jeffery Allen ◽  
...  
Keyword(s):  
Electronic Components

SHADE: Automated Refinement of PCB Component Estimates Using Detected Shadows

2020 ◽  
Author(s):  
Nathan T. Jessurun ◽  
Olivia P. Paradis ◽  
Mark Tehranipoor ◽  
Navid Asadizanjani

scholarly journals Using Digital Sensors to Leverage Chips' Security

2020 ◽  
Author(s):  
Mohammad Ebrahimabadi ◽  
Md Toufiq Hasan Anik ◽  
Jean-Luc Danger ◽  
Sylvain Guilley ◽  
Naghmeh Karimi

ReCon: From the Bitstream to Piracy Detection

2020 ◽  
Author(s):  
Grant Skipper ◽  
Christopher Sozio ◽  
Adam Duncan ◽  
Andrew Lukefahr ◽  
Martin Swany
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