Development of the technology of systems on a chip for a modern electronic component base ECB

Without the creation of Russian technology for designing SoC, it is impossible to provide a modern level of VLSI development, both for defense and civil applications. This is in line with global development trends. Nevertheless, it is necessary to highlight only those essential processes that are most consistent with Russian realities and can help in solving specific problems of the defense industry and the economy as a whole at the lowest cost and in the shortest possible time. The most important element of the implementation of SoC technology is the organization of a single sign-on to locate the production of microcircuits based on this technology. This will allow to drastically reduce costs, to certify the system of complex functional blocks, to increase the reliability and sustainability of developments. Even in organizational terms, this will allow an organized firm (conditionally - Silicon Gate) to be included as a certified chip manufacturer in any contracts with MO. The article discusses the structuring of programs for the development of domestic technology of SoC systems on a chip, the coordination of the SoC area of developments and complex functional blocks, as well as their information support.

Circuit engineering methods for ensuring ECB resistance to the effects of heavy charged particles

The paper considers circuit engineering methods for protecting the electronic component base from the effects of heavy charged particles. One of the main methods is to increase the capacity of the device, which leads to an increase in the capacity of diffusion regions and a decrease in the frequency of single events. The structure of a capacitor is shown, which is connected to various nodes of the circuit to increase the sensitivity of the capacitance of the node. The article focuses on the method of using active RC circuits in the feedback circuit of a storage device cell. The advantages and disadvantages of the methods of using a storage device cell with internal redundancy are noted. The paper shows that the use of circuit engineering methods will provide the required level of fault and fault tolerance to the effects of heavy charged particles.

General approaches to assessing the resistance to the effects of ionizing radiation of outer space for foreign electronic component base of development enterprises

The analysis of information on the stability of the electronic component base (ECB) in the development of radio-electronic equipment (REE) of spacecraft (spacecraft) is an important and urgent task. The paper considers the main components of the approaches of foreign organizations developing radio space technology to ensure its radiation resistance. The design approaches of Thales Alenia Space, Airbus Defense and Space, and the European Space Agency are presented. The article outlines the main directions for optimizing the procedures for the preliminary selection of ECB, which consist in ensuring the required resistance of REE SC at the ECB level with ensuring the reliability of data on durability, in minimizing the costs of applying resistance enhancement measures (through the use of a promising ECB with increased resistance characteristics), to replace ECB.

Sensitivity analysis and test results of the electronic component base to the effects of heavy charged particles

The work is devoted to the study of the sensitivity of the electronic component base (ECB) to the effects of heavy charged particles. At the same time, the degree of sensitivity is distinguished depending on the functional group of ECB products to the effects of ionization radiation from outer space and on the design and technological design of ECB products. The paper presents the characteristics and conditions for the use of ECB in the radio-electronic equipment of outer space to ensure minimal sensitivity to the effects of ionization radiation and to the thyristor effect. After the sensitivity analysis of ECB products is carried out, a preliminary selection of ECB is performed, requiring testing. The article discusses the criteria for determining the ECB that requires testing and is possible to use without testing. The methods of increasing the durability of radio-electronic equipment of space equipment and the directions of optimization of the methodology of analysis of ECB lists are determined.

ANALYSIS OF EXISTING METHODS FOR MODELING THE IMPACT OF SPACE RADIATION ON THE ELECTRONIC COMPONENT BASE

The paper considers the modeling of radiation effects in design automation tools. Special at-tention is paid to the development of complex functional blocks and microelectronic products based on them, which require ensuring technological independence when creating modern control sys-tems, data processing and communication.

Improved YOLOv4-tiny network for real-time electronic component detection

In the electronics industry environment, rapid recognition of objects to be grasped from digital images is essential for visual guidance of intelligent robots. However, electronic components have a small size, are difficult to distinguish, and are in motion on a conveyor belt, making target detection more difficult. For this reason, the YOLOv4-tiny method is used to detect electronic components and is improved. Then, different network structures are built for the adaptive integration of middle- and high-level features to address the phenomenon in which the original algorithm integrates all feature information indiscriminately. The method is deployed on an electronic component dataset for validation. Experimental results show that the accuracy of the original algorithm is improved from 93.74 to 98.6%. Compared with other current mainstream algorithms, such as Faster RCNN, SSD, RefineDet, EfficientDet, and YOLOv4, the method can maintain high detection accuracy at the fastest speed. The method can provide a technical reference for the development of manufacturing robots in the electronics industry.