2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Latest Publications

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Published By IEEE

9781538603529

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

VPUF: Voter based physical unclonable function with high reliability and modeling attack resistance

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046200 ◽

2017 ◽

Cited By ~ 5

Author(s):

Jing Ye ◽

Yu Hu ◽

Xiaowei Li

Keyword(s):

High Reliability ◽

Physical Unclonable Function

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Energy-efficient and error-resilient iterative solvers for approximate computing

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046244 ◽

2017 ◽

Cited By ~ 2

Author(s):

Alexander Scholl ◽

Claus Braun ◽

Hans-Joachim Wunderlich

Keyword(s):

Energy Efficient ◽

Iterative Solvers ◽

Approximate Computing ◽

Error Resilient

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Reliable gas sensing with memristive array

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046228 ◽

2017 ◽

Cited By ~ 1

Author(s):

Adedotun Adeyemo ◽

Abusaleh Jabir ◽

Jimson Mathew ◽

Eugenio Martinelli ◽

Corrado Di Natale ◽

...

Keyword(s):

Gas Sensing

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Voltage margins identification on commercial x86-64 multicore microprocessors

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046198 ◽

2017 ◽

Cited By ~ 7

Author(s):

George Papadimitriou ◽

Manolis Kaliorakis ◽

Athanasios Chatzidimitriou ◽

Charalampos Magdalinos ◽

Dimitris Gizopoulos

Keyword(s):

Multicore Microprocessors

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Hardware Trojans classification for gate-level netlists using multi-layer neural networks

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046227 ◽

2017 ◽

Cited By ~ 23

Author(s):

Kento Hasegawa ◽

Masao Yanagisawa ◽

Nozomu Togawa

Keyword(s):

Neural Networks ◽

Hardware Trojans

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[Front matter]

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046165 ◽

2017 ◽

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Investigation of critical path selection for in-situ monitors insertion

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046229 ◽

2017 ◽

Cited By ~ 1

Author(s):

F. Cacho ◽

A. Benhassain ◽

R. Shah ◽

S. Mhira ◽

V. Huard ◽

...

Keyword(s):

Critical Path ◽

Path Selection ◽

Selection For ◽

Critical Path Selection

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Reliability of computing systems: From flip flops to variables

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046242 ◽

2017 ◽

Author(s):

Giorgio Di Natale ◽

Maha Kooli ◽

Alberto Bosio ◽

Michele Portolan ◽

Regis Leveugle

Keyword(s):

Computing Systems

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Diagnosis with transition faults on embedded segments

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046173 ◽

2017 ◽

Author(s):

Theodoros Toulas ◽

Spyros Tragoudas

Keyword(s):

Transition Faults

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Simulation-based analysis of FF behavior in presence of power supply noise

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046211 ◽

2017 ◽

Cited By ~ 2

Author(s):

Yukiya Miura ◽

Takuya Yamamoto

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

Supply Noise ◽

Simulation Based

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2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

VPUF: Voter based physical unclonable function with high reliability and modeling attack resistance

Energy-efficient and error-resilient iterative solvers for approximate computing

Reliable gas sensing with memristive array

Voltage margins identification on commercial x86-64 multicore microprocessors

Hardware Trojans classification for gate-level netlists using multi-layer neural networks

[Front matter]

Investigation of critical path selection for in-situ monitors insertion

Reliability of computing systems: From flip flops to variables

Diagnosis with transition faults on embedded segments

Simulation-based analysis of FF behavior in presence of power supply noise

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Latest Publications