Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)
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A study of ESD sensitivity in AMR and GMR recording heads

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737057 ◽

2002 ◽

Cited By ~ 21

Author(s):

C.F. Lam ◽

C. Chang ◽

R. Karimi

Keyword(s):

Recording Heads

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Evaluation of wrist strap monitors from an MR head perspective

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737055 ◽

2002 ◽

Author(s):

F. Gocemen ◽

M. Szymanski ◽

J. Salisbury ◽

M. Sanchez

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Measures against electrostatic destruction of electronic devices at electronic equipment assembly shops

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737041 ◽

2002 ◽

Author(s):

K. Saotome ◽

K. Matsuhashi

Keyword(s):

Electronic Devices ◽

Electronic Equipment

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Discussion on electric parameters of standard for anti-electrostatic floor

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737032 ◽

2002 ◽

Author(s):

W. Zonghan ◽

C. Quan ◽

W. Yue ◽

S. Jian ◽

F. Jianping ◽

...

Keyword(s):

Electric Parameters

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Controlling ESD and absorbing and shielding EMW by using conductive fiber in aircraft

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737017 ◽

2002 ◽

Cited By ~ 2

Author(s):

T. Hiramoto ◽

T. Terauchi ◽

J. Tomibe

Keyword(s):

Conductive Fiber

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Investigations on the thermal behavior of interconnects under ESD transients using a simplified thermal RC network

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737038 ◽

2002 ◽

Cited By ~ 15

Author(s):

P. Salome ◽

C. Leroux ◽

P. Crevel ◽

J.P. Chante

Keyword(s):

Thermal Behavior

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A simulation study of HBM failure in an internal clock buffer and the design issues for efficient power pin protection strategy

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737027 ◽

2002 ◽

Cited By ~ 16

Author(s):

V. Puvvada ◽

C. Duvvury

Keyword(s):

Simulation Study ◽

Internal Clock ◽

Design Issues ◽

Protection Strategy ◽

Efficient Power

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Investigation into socketed CDM (SDM) tester parasitics

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737050 ◽

2002 ◽

Cited By ~ 4

Author(s):

M. Chaine ◽

K. Verhaege ◽

L. Avery ◽

M. Kelly ◽

H. Gieser ◽

...

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Magneto optical static event detector

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737043 ◽

2002 ◽

Cited By ~ 3

Author(s):

N. Jacksen ◽

W. Tan ◽

D. Boehm

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Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737037 ◽

2002 ◽

Cited By ~ 31

Author(s):

C. Russ ◽

K. Bock ◽

M. Rasras ◽

I. De Wolf ◽

G. Groeseneken ◽

...

Keyword(s):

Transmission Line ◽

Emission Microscopy

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Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A study of ESD sensitivity in AMR and GMR recording heads

Evaluation of wrist strap monitors from an MR head perspective

Measures against electrostatic destruction of electronic devices at electronic equipment assembly shops

Discussion on electric parameters of standard for anti-electrostatic floor

Controlling ESD and absorbing and shielding EMW by using conductive fiber in aircraft

Investigations on the thermal behavior of interconnects under ESD transients using a simplified thermal RC network

A simulation study of HBM failure in an internal clock buffer and the design issues for efficient power pin protection strategy

Investigation into socketed CDM (SDM) tester parasitics

Magneto optical static event detector

Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)
Latest Publications