Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)
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Evaluation of wrist strap monitors from an MR head perspective

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737055 ◽

2002 ◽

Author(s):

F. Gocemen ◽

M. Szymanski ◽

J. Salisbury ◽

M. Sanchez

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Measures against electrostatic destruction of electronic devices at electronic equipment assembly shops

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737041 ◽

2002 ◽

Author(s):

K. Saotome ◽

K. Matsuhashi

Keyword(s):

Electronic Devices ◽

Electronic Equipment

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A study of ESD sensitivity in AMR and GMR recording heads

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737057 ◽

2002 ◽

Author(s):

C.F. Lam ◽

C. Chang ◽

R. Karimi

Keyword(s):

Recording Heads

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Controlling ESD and absorbing and shielding EMW by using conductive fiber in aircraft

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737017 ◽

2002 ◽

Author(s):

T. Hiramoto ◽

T. Terauchi ◽

J. Tomibe

Keyword(s):

Conductive Fiber

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Discussion on electric parameters of standard for anti-electrostatic floor

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737032 ◽

2002 ◽

Author(s):

W. Zonghan ◽

C. Quan ◽

W. Yue ◽

S. Jian ◽

F. Jianping ◽

...

Keyword(s):

Electric Parameters

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Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737037 ◽

2002 ◽

Author(s):

C. Russ ◽

K. Bock ◽

M. Rasras ◽

I. De Wolf ◽

G. Groeseneken ◽

...

Keyword(s):

Transmission Line ◽

Emission Microscopy

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Investigations on the thermal behavior of interconnects under ESD transients using a simplified thermal RC network

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737038 ◽

2002 ◽

Author(s):

P. Salome ◽

C. Leroux ◽

P. Crevel ◽

J.P. Chante

Keyword(s):

Thermal Behavior

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A simulation study of HBM failure in an internal clock buffer and the design issues for efficient power pin protection strategy

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737027 ◽

2002 ◽

Author(s):

V. Puvvada ◽

C. Duvvury

Keyword(s):

Simulation Study ◽

Internal Clock ◽

Design Issues ◽

Protection Strategy ◽

Efficient Power

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Investigation into socketed CDM (SDM) tester parasitics

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737050 ◽

2002 ◽

Author(s):

M. Chaine ◽

K. Verhaege ◽

L. Avery ◽

M. Kelly ◽

H. Gieser ◽

...

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Magneto optical static event detector

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737043 ◽

2002 ◽

Author(s):

N. Jacksen ◽

W. Tan ◽

D. Boehm

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