1991, Proceedings. International Test Conference
Latest Publications

TOTAL DOCUMENTS

144

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

0818691565

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

For Test Automation, Silicon is Free

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519786 ◽

2005 ◽

Author(s):

T. Gheewala

Keyword(s):

Test Automation

IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519754 ◽

2005 ◽

Cited By ~ 6

Author(s):

W.C. Bruce ◽

M.G. Gallup ◽

G. Giles ◽

T. Munns

TWO-STAGE FAULT LOCATION

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519762 ◽

2005 ◽

Cited By ~ 51

Author(s):

P.G. Ryan ◽

S. Rawat ◽

W.K. Fuchs

Keyword(s):

Fault Location ◽

Two Stage

ENHANCING BOARD FUNCTIONAL SELF-TEST BY CONCURRENT SAMPLING

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519727 ◽

2005 ◽

Cited By ~ 4

Author(s):

K.D. Wagner ◽

T.W. Williams

Keyword(s):

Self Test

FAULT MODELING FOR THE TESTING OF MIXED INTEGRATED CIRCUITS

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519719 ◽

2005 ◽

Cited By ~ 62

Author(s):

A. Meixner ◽

W. Maly

Keyword(s):

Integrated Circuits ◽

Fault Modeling

Delay Testing Quality in Timing-Optimized Designs

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519756 ◽

2005 ◽

Cited By ~ 11

Author(s):

Eun Sei Park ◽

B. Underwood ◽

T.W. Williams ◽

M.R. Mercer

Keyword(s):

Delay Testing

Minimal Test Sets for Combinational Circuits

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519511 ◽

2005 ◽

Cited By ~ 42

Author(s):

G. Tromp

Keyword(s):

Combinational Circuits ◽

Test Sets

ADVANCED MIXED SIGNAL TESTING BY DSP LOCALIZED TESTER

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519774 ◽

2005 ◽

Cited By ~ 5

Author(s):

K. Karube ◽

Y. Bessho ◽

T. Takakura ◽

K. Gunji

Keyword(s):

Mixed Signal ◽

Mixed Signal Testing

CHARACTERIZATION AND CONTROL OF PLCC AND MQFP LEAD INSPECTION SYSTEMS

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519693 ◽

2005 ◽

Author(s):

S.A. Erjavic

Keyword(s):

Inspection Systems ◽

And Control

MAXIMIZING AND MAINTAINING AC TEST ACCURACY IN THE MANUFACTURING ENVIRONMENT

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519764 ◽

2005 ◽

Cited By ~ 1

Author(s):

R.J. Bulaga ◽

E.F. Westermann

Keyword(s):

Test Accuracy ◽

Manufacturing Environment

1991, Proceedings. International Test ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

For Test Automation, Silicon is Free

IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS

TWO-STAGE FAULT LOCATION

ENHANCING BOARD FUNCTIONAL SELF-TEST BY CONCURRENT SAMPLING

FAULT MODELING FOR THE TESTING OF MIXED INTEGRATED CIRCUITS

Delay Testing Quality in Timing-Optimized Designs

Minimal Test Sets for Combinational Circuits

ADVANCED MIXED SIGNAL TESTING BY DSP LOCALIZED TESTER

CHARACTERIZATION AND CONTROL OF PLCC AND MQFP LEAD INSPECTION SYSTEMS

MAXIMIZING AND MAINTAINING AC TEST ACCURACY IN THE MANUFACTURING ENVIRONMENT

1991, Proceedings. International Test Conference
Latest Publications