1991, Proceedings. International Test Conference
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TOTAL DOCUMENTS

144

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25

(FIVE YEARS 0)

Published By IEEE

0818691565

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ENHANCING BOARD FUNCTIONAL SELF-TEST BY CONCURRENT SAMPLING

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519727 ◽

2005 ◽

Author(s):

K.D. Wagner ◽

T.W. Williams

Keyword(s):

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FAULT MODELING FOR THE TESTING OF MIXED INTEGRATED CIRCUITS

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519719 ◽

2005 ◽

Author(s):

A. Meixner ◽

W. Maly

Keyword(s):

Integrated Circuits ◽

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Delay Testing Quality in Timing-Optimized Designs

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519756 ◽

2005 ◽

Author(s):

Eun Sei Park ◽

B. Underwood ◽

T.W. Williams ◽

M.R. Mercer

Keyword(s):

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Minimal Test Sets for Combinational Circuits

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519511 ◽

2005 ◽

Author(s):

G. Tromp

Keyword(s):

Combinational Circuits ◽

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ADVANCED MIXED SIGNAL TESTING BY DSP LOCALIZED TESTER

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519774 ◽

2005 ◽

Author(s):

K. Karube ◽

Y. Bessho ◽

T. Takakura ◽

K. Gunji

Keyword(s):

Mixed Signal ◽

Mixed Signal Testing

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IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519754 ◽

2005 ◽

Author(s):

W.C. Bruce ◽

M.G. Gallup ◽

G. Giles ◽

T. Munns

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TWO-STAGE FAULT LOCATION

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519762 ◽

2005 ◽

Author(s):

P.G. Ryan ◽

S. Rawat ◽

W.K. Fuchs

Keyword(s):

Fault Location ◽

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For Test Automation, Silicon is Free

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519786 ◽

2005 ◽

Author(s):

T. Gheewala

Keyword(s):

Test Automation

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Distributed Layout Verification Using Sequential Software and Standard Hardware

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519768 ◽

2005 ◽

Author(s):

Y. Shiran

Keyword(s):

Layout Verification

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Defect Level Estimation of Random and Pseudorandom Testing

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519736 ◽

2005 ◽

Author(s):

Wen-Ben Jone

Keyword(s):

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