2017 IEEE 35th VLSI Test Symposium (VTS)
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9781509044825
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Special session on early life failures

2017 ◽  
Author(s):  
Jyotirmoy Deshmukh ◽  
Wolfgang Kunz ◽  
Hans-Joachim Wunderlich ◽  
Sybille Hellebrand
Keyword(s):  
Early Life ◽  
Special Session

At-speed capture global noise reduction & low-power memory test architecture

2017 ◽  
Author(s):  
Bonita Bhaskaran ◽  
Sailendra Chadalavada ◽  
Shantanu Sarangi ◽  
Nithin Valentine ◽  
Venkat Abilash Reddy Nerallapally ◽  
...  
Keyword(s):  
Low Power ◽  
Noise Reduction ◽  
Memory Test ◽  
Test Architecture

Efficient SAT-based generation of hazard-activated TSOF tests

2017 ◽  
Author(s):  
Jan Burchard ◽  
Dominik Erb ◽  
Sudhakar M. Reddy ◽  
Adit D. Singh ◽  
Bernd Becker
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