2016 IEEE Workshop on Microelectronics and Electron Devices (WMED)
Latest Publications

TOTAL DOCUMENTS

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H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781467383974, 9781467383998

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Posters

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458249 ◽

2016 ◽

Invited tutorials

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458247 ◽

2016 ◽

Author(s):

Subu Iyer ◽

Larry D. Smith

Fabrication and Characterization of Flexible Thin Film Transistors on Thin Solution-Cast Substrates

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458277 ◽

2016 ◽

Cited By ~ 1

Author(s):

Haoyu U. Li ◽

Thomas N. Jackson

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Solution Cast ◽

Fabrication And Characterization

First Measurements of a Microwave Frequency Comb with a Semiconductor Sample in a Scanning Tunneling Microscope

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458278 ◽

2016 ◽

Cited By ~ 3

Author(s):

Chad Rhoades ◽

Joel Rasmussen ◽

Patrick H. Bowles ◽

Mark J. Hagmann ◽

Dmitry A. Yarotski

Keyword(s):

Scanning Tunneling Microscope ◽

Frequency Comb ◽

Microwave Frequency ◽

Scanning Tunneling ◽

Tunneling Microscope ◽

Semiconductor Sample

Process and Metrology Challenges for Nano-Scale Electronics

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458281 ◽

2016 ◽

Author(s):

Michael I. Current

Keyword(s):

Nano Scale

[Copyright notice]

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458240 ◽

2016 ◽

Keyword(s):

Welcome message

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458242 ◽

2016 ◽

Big Data and Predictive Analytics Methods for Modeling and Analysis of Semiconductor Manufacturing Processes

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458273 ◽

2016 ◽

Cited By ~ 5

Author(s):

Sujata Butte ◽

Sainath Patil

Keyword(s):

Big Data ◽

Semiconductor Manufacturing ◽

Predictive Analytics ◽

Manufacturing Processes ◽

Modeling And Analysis

Keynote talk

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458246 ◽

2016 ◽

Author index

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED) ◽

10.1109/wmed.2016.7458250 ◽

2016 ◽

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Posters

Invited tutorials

Fabrication and Characterization of Flexible Thin Film Transistors on Thin Solution-Cast Substrates

First Measurements of a Microwave Frequency Comb with a Semiconductor Sample in a Scanning Tunneling Microscope

Process and Metrology Challenges for Nano-Scale Electronics

[Copyright notice]

Welcome message

Big Data and Predictive Analytics Methods for Modeling and Analysis of Semiconductor Manufacturing Processes

Keynote talk

Author index

2016 IEEE Workshop on Microelectronics and Electron Devices (WMED)
Latest Publications