2010 19th IEEE Asian Test Symposium
Latest Publications

TOTAL DOCUMENTS

86
(FIVE YEARS 0)

H-INDEX

11
(FIVE YEARS 0)

Published By IEEE

9781424488414
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Quasi-best Random Testing

2010 ◽  
Author(s):  
Shiyi Xu ◽  
Peng Xu
Keyword(s):  
Random Testing

scholarly journals Defect Coverage-Driven Window-Based Test Compression

2010 ◽  
Author(s):  
Xrysovalantis Kavousianos ◽  
Krishnendu Chakrabarty ◽  
Emmanouil Kalligeros ◽  
Vasileios Tenentes
Keyword(s):  
Defect Coverage ◽  
Test Compression

Mining Complex Boolean Expressions for Sequential Equivalence Checking

2010 ◽  
Author(s):  
Neha Goel ◽  
Michael S. Hsiao ◽  
Narendran Ramakrishnan ◽  
Mohammed J. Zaki
Keyword(s):  
Equivalence Checking ◽  
Mining Complex ◽  
Sequential Equivalence Checking ◽  
Boolean Expressions

A Memory Fault Simulator for Radiation-Induced Effects in SRAMs

2010 ◽  
Author(s):  
P. Rech ◽  
A. Bosio ◽  
P. Girard ◽  
S. Pravossoudovitch ◽  
A. Virazel ◽  
...  
Keyword(s):  
Radiation Induced

Performance Characterization of TSV in 3D IC via Sensitivity Analysis

2010 ◽  
Author(s):  
Jhih-Wei You ◽  
Shi-Yu Huang ◽  
Ding-Ming Kwai ◽  
Yung-Fa Chou ◽  
Cheng-Wen Wu
Keyword(s):  
Sensitivity Analysis ◽  
Performance Characterization ◽  
3D Ic
Load More ...
Sign in / Sign up

Export Citation Format

Share Document