2021 IEEE/ACM 6th International Workshop on Metamorphic Testing (MET)
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9781665444644

Author(s):  
Zhirui Zhang ◽  
Dave Towey ◽  
Zhihao Ying ◽  
Yifan Zhang ◽  
Zhi Quan Zhou






Author(s):  
Madeline Diep ◽  
Rohan Reddy Mekala ◽  
Ujjwal Ayyangar ◽  
Gudjon Magnusson ◽  
Adam Porter ◽  
...  


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