X-Ray Microscopy III - Springer Series in Optical Sciences
Latest Publications

TOTAL DOCUMENTS

110

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By Springer Berlin Heidelberg

9783662138946, 9783540468875

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

X-Ray Holography at Lawrence Livermore National Laboratory

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_59 ◽

1992 ◽

pp. 255-258

Author(s):

J. Trebes ◽

C. Annese ◽

D. Birdsall ◽

J. Brase ◽

J. Gray ◽

...

Keyword(s):

Lawrence Livermore National Laboratory ◽

National Laboratory ◽

X Ray

Quantitative Microtomography Using a 10 µm Polychromatic X-Ray Beam from a Laboratory Source

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_104 ◽

1992 ◽

pp. 458-460 ◽

Cited By ~ 3

Author(s):

G. R. Davis ◽

J. C. Elliott ◽

P. Anderson

Keyword(s):

X Ray ◽

Laboratory Source

Sub-nanosecond X-Ray Diffraction from Laser-Shocked Crystals

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_103 ◽

1992 ◽

pp. 455-457 ◽

Cited By ~ 1

Author(s):

J. S. Wark

Keyword(s):

X Ray Diffraction ◽

X Ray

The Study of Silica Deposition in the Leaf Blade of Zea mays L. by X-Ray Contact Microradiography and Confocal Microscopy

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_94 ◽

1992 ◽

pp. 417-422 ◽

Cited By ~ 2

Author(s):

P. C. Cheng ◽

H. G. Kim ◽

T. H. Lin

Keyword(s):

Zea Mays ◽

Confocal Microscopy ◽

Leaf Blade ◽

Zea Mays L ◽

Silica Deposition ◽

X Ray ◽

Contact Microradiography

Aspects of Nanopositioning in Stage Design for Scanning X-Ray Microscopes

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_81 ◽

1992 ◽

pp. 355-358 ◽

Cited By ~ 1

Author(s):

M. T. Browne

Keyword(s):

Stage Design ◽

X Ray

Temperature Rise of Objects in X-Ray Microscopy — Measurements and Calculations

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_72 ◽

1992 ◽

pp. 316-318

Author(s):

B. Greinke ◽

P. Gölz

Keyword(s):

Temperature Rise ◽

X Ray

Radiation Damage to Cells by Ultrasoft X-Rays

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_70 ◽

1992 ◽

pp. 306-312 ◽

Cited By ~ 2

Author(s):

M. Folkard

Keyword(s):

Radiation Damage ◽

X Rays

Repetitive Laser-Plasma X-Ray Source for Microscopy Applications

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_7 ◽

1992 ◽

pp. 43-46

Author(s):

H. Daido ◽

G. M. Zeng ◽

T. Togawa ◽

H. Aritome ◽

M. Nakatsuka ◽

...

Keyword(s):

Laser Plasma ◽

X Ray

X-Ray Tomographic Microscopy

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_39 ◽

1992 ◽

pp. 167-176 ◽

Cited By ~ 1

Author(s):

U. Bonse ◽

R. Nußhardt ◽

F. Busch ◽

J. H. Kinney ◽

R. A. Saroyan ◽

...

Keyword(s):

X Ray

The X-Ray Scanning Microscope Beam Branch Line and Its Scanning System Design at BEPC

X-Ray Microscopy III - Springer Series in Optical Sciences ◽

10.1007/978-3-540-46887-5_35 ◽

1992 ◽

pp. 154-156

Author(s):

Deming Shu ◽

Wei Wang ◽

Motuo Wang ◽

Jing Liu ◽

Wei He ◽

...

Keyword(s):

System Design ◽

Scanning System ◽

Scanning Microscope ◽

Branch Line ◽

X Ray

X-Ray Microscopy III - Springer Series in Optical SciencesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

X-Ray Holography at Lawrence Livermore National Laboratory

Quantitative Microtomography Using a 10 µm Polychromatic X-Ray Beam from a Laboratory Source

Sub-nanosecond X-Ray Diffraction from Laser-Shocked Crystals

The Study of Silica Deposition in the Leaf Blade of Zea mays L. by X-Ray Contact Microradiography and Confocal Microscopy

Aspects of Nanopositioning in Stage Design for Scanning X-Ray Microscopes

Temperature Rise of Objects in X-Ray Microscopy — Measurements and Calculations

Radiation Damage to Cells by Ultrasoft X-Rays

Repetitive Laser-Plasma X-Ray Source for Microscopy Applications

X-Ray Tomographic Microscopy

The X-Ray Scanning Microscope Beam Branch Line and Its Scanning System Design at BEPC

X-Ray Microscopy III - Springer Series in Optical Sciences
Latest Publications