Fifth International Conference on Actual Problems of Electron Devices Engineering
Latest Publications

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Published By IEEE

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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Features distribution of supershort pulses in passive elements of a microwave trakt

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044892 ◽

2003 ◽

Author(s):

V.A. Ivanchenko ◽

V.N. Gusyatnikov ◽

V.V. Nikolaev

Warning system of segments faults in cable lines 6 kV

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044958 ◽

2003 ◽

Author(s):

A.Yu. Miroshnichenco ◽

A.V. Niconov ◽

N.M. Sovetov ◽

D.A. Stepanov

Keyword(s):

Warning System ◽

Cable Lines

Manufacturing techniques of the electroluminescent condenser on basis glassiness binding

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044975 ◽

2003 ◽

Author(s):

L.V. Havanova ◽

V.E. Evsteshenkova ◽

M.M. Sychev ◽

A.I. Kuznetsov

Keyword(s):

Manufacturing Techniques

Theoretical and experimental study of the intensive high-convergence electron beams current-transmission

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044885 ◽

2003 ◽

Author(s):

Y.G. Gamayunov ◽

A.I. Toreev ◽

D.V. Mironov

Keyword(s):

Experimental Study ◽

Electron Beams ◽

Current Transmission

Phase detecting supershort microwave pulses

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044893 ◽

2003 ◽

Author(s):

V.A. Ivanchenko ◽

V.N. Gusyatnikov ◽

Yu.I. Lykov ◽

V.V. Nikolaev

Keyword(s):

Microwave Pulses

Defect formation and transport processes on surface of the semiconductor at electrodegradation of a system the metal-semiconductor

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044939 ◽

2003 ◽

Author(s):

A.A. Scvortsov ◽

A.A. Salanov

Keyword(s):

Defect Formation ◽

Transport Processes

Pretreatment of the photomaps

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044947 ◽

2003 ◽

Author(s):

T.V. Danilova ◽

A.O. Manturov

Nonmutual coupled ferrite transmission lines

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044933 ◽

2003 ◽

Author(s):

A.A. Dimitryuk

Keyword(s):

Transmission Lines

Calculation of the field uniformly magnetized autonomous sources on the basis of the solution magnetostatic equations Maxwell in space of generalized functions

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044956 ◽

2003 ◽

Author(s):

A.N. Pavlov ◽

Y.A. Zyuryukin

Keyword(s):

Generalized Functions ◽

Space Of Generalized Functions

P-L method of verification. Conditional decoding

Fifth International Conference on Actual Problems of Electron Devices Engineering ◽

10.1109/apede.2002.1044961 ◽

2003 ◽

Author(s):

V.S. Gumaliev

Fifth International Conference on Actual Problems of Electron Devices EngineeringLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Features distribution of supershort pulses in passive elements of a microwave trakt

Warning system of segments faults in cable lines 6 kV

Manufacturing techniques of the electroluminescent condenser on basis glassiness binding

Theoretical and experimental study of the intensive high-convergence electron beams current-transmission

Phase detecting supershort microwave pulses

Defect formation and transport processes on surface of the semiconductor at electrodegradation of a system the metal-semiconductor

Pretreatment of the photomaps

Nonmutual coupled ferrite transmission lines

Calculation of the field uniformly magnetized autonomous sources on the basis of the solution magnetostatic equations Maxwell in space of generalized functions

P-L method of verification. Conditional decoding

Fifth International Conference on Actual Problems of Electron Devices Engineering
Latest Publications